From f0998ecd98dc405e11a5f22f327028e1d00b9c86 Mon Sep 17 00:00:00 2001 From: Rumps Date: Tue, 6 Dec 2016 08:18:48 +0000 Subject: [PATCH] Started SeekingAlphaScraper --- .gitignore | 2 + firstfew.xml | 4841 ------------------- firstfewbackup.xml | 4841 ------------------- README.md => patent-slurper/README.md | 0 patent-slurper/patent-slurper.pl | 183 + patent_slurper.pl | 104 - patentlast.xml | 723 --- patentsfirst.xml | 771 --- seeking-alpha-scraper/transcripts_spider.py | 73 + 9 files changed, 258 insertions(+), 11280 deletions(-) delete mode 100644 firstfew.xml delete mode 100644 firstfewbackup.xml rename README.md => patent-slurper/README.md (100%) create mode 100644 patent-slurper/patent-slurper.pl delete mode 100644 patent_slurper.pl delete mode 100644 patentlast.xml delete mode 100644 patentsfirst.xml create mode 100644 seeking-alpha-scraper/transcripts_spider.py diff --git a/.gitignore b/.gitignore index ae2ad53..92cf4fe 100644 --- a/.gitignore +++ b/.gitignore @@ -18,3 +18,5 @@ nytprof.out *.o *.bs /_eumm/ +*.sh +sql/ \ No newline at end of file diff --git a/firstfew.xml b/firstfew.xml deleted file mode 100644 index 66d2fd4..0000000 --- a/firstfew.xml +++ /dev/null @@ -1,4841 +0,0 @@ - - - - - - -US -D0724291 -S1 -20150317 - - - - -US -29454067 -20130506 - - -29 - -14 - - -10 -0201 - - -US -D 2713 - D2947 - D2980 - -Non-slip hosiery - - - - -US -1210066 -A -Hara -19161200 - - -cited by examiner -US 36176 - - - - -US -2860416 -A -Pfund -19581100 - - -cited by examiner -US 33 3 A - - - - -US -4149274 -A -Garrou et al. -19790400 - - -cited by applicant - - - - -US -4651354 -A -Petrey -19870300 - - -cited by applicant - - - - -US -4728538 -A -Kaspar et al. -19880300 - - -cited by applicant - - - - -US -5412957 -A -Bradberry et al. -19950500 - - -cited by applicant - - - - -US -D380593 -S -Lauzon -19970700 - - -cited by examiner -USD 2920 - - - - -US -5737776 -A -Jennings -19980400 - - -cited by examiner -US 2409 - - - - -US -5768713 -A -Crick -19980600 - - -cited by examiner -US 2409 - - - - -US -D428689 -S -Guiotto et al. -20000800 - - -cited by examiner -USD 2961 - - - - -US -D437990 -S -Hooper -20010200 - - -cited by examiner -USD 2961 - - - - -US -D513662 -S -Bayly et al. -20060100 - - -cited by examiner -USD 2961 - - - - -US -D545532 -S -Sawtelle et al. -20070700 - - -cited by examiner -USD 2947 - - - - -US -D554836 -S -Shaffer -20071100 - - -cited by examiner -USD 2951 - - - - -US -D555889 -S -Anders et al. -20071100 - - -cited by examiner -USD 2961 - - - - -US -D577884 -S -Swilley, Sr. -20081000 - - -cited by examiner -USD 2961 - - - - -US -D578734 -S -Lewis -20081000 - - -cited by examiner -USD 2732 - - - - -US -D583137 -S -Ringholz -20081200 - - -cited by examiner -USD 2953 - - - - -US -D625501 -S -Lidtke -20101000 - - -cited by examiner -USD 2961 - - - - -US -D656303 -S -Muller et al. -20120300 - - -cited by examiner -USD 2947 - - - - -US -D710629 -S -Franco -20140800 - - -cited by examiner -USD 6608 - - - - -US -2004/0009302 -A1 -Patterson -20040100 - - -cited by applicant - - - - -US -2008/0189829 -A1 -Fusco -20080800 - - -cited by examiner -US 2239 - - - - -US -2011/0119809 -A1 -Huckemeyer -20110500 - - -cited by examiner -US 2239 - - - - -US -2011/0225847 -A1 -Buchanan -20110900 - - -cited by examiner -US 36 96 - - - - -US -2014/0250568 -A1 -MacDonald et al. -20140900 - - -cited by examiner -US 2239 - - - -Professional Fishnet Tights with Cotton Sole, announced Mar. 22, 2013 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.sockdreams.com/products/professional-fishnet-tights-with-cotton-sole:11749>. - -cited by examiner - - - -Kushyfoot Tights and Flats-To-Go, announced Jan. 4, 2012 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.thanksmailcarrier.com/2012/01/kushyfoot-tights-and-flats-to-go-review.html>. - -cited by examiner - - - -HUE Women's 3-Pack Micro Net Liner, announced Jun. 25, 2011 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.amazon.com/HUE-Womens-3-Pack-Micro-Liner/dp/B002JM0S5O>. - -cited by examiner - - - -Sure-Grip Terrycloth Slippers, announced Nov. 18, 2011 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.medline.com/jump/product/x/Z05-PF02319>. - -cited by examiner - - - -Springer Link; A study of the distribution of load under the normal foot during walking; Article; Oct. 1979; Three Pages; International Orthopaedics, vol. 3, Issue 2, pp. 153-157; http://link.springer.com/article/10.1007/BF00266887. - -cited by applicant - - - -D. Rosenbaum and H.P. Becker; Plantar pressure distribution measurements. Technical background and clinical applications; Oct. 30, 2003; Two Pages; 1997 Blackwell Science Ltd., Foot and Ankle Surgery, vol. 3, Issue 1, pp. 1-24, Mar. 1997; http://onlinelibrary.wiley.com/doi/10.1046/j.1460-9584.1997.00043.x/abstract. - -cited by applicant - - - -Amit Gefen, PhD; Pressure-Sensing Devices for Assessment of Soft Tissue Loading Under Bony Prominences: Technological Concepts and Clinical U; Dec. 12, 2007; Twelve Pages; vol. 19—Issue 12—Dec. 2007 (/issue/78); http://www.woundsresearch.com/article/8106. - -cited by applicant - - - -Martinus Richter, Michael Frink, Stefan Zech, Jens Geerling, Patrizia Droste, Karsten Knobloch, Christian Krettek; Technique for Intraoperative Use of Pedography; Journal; Jun. 2006; One Page; Techniques in Foot & Ankle Surgery: Jun. 2006—vol. 5—Issue 2—pp. 88-100; http://journals.lww.com/techfootankle/Abstract/2006/06000/TechniqueforIntraoperativeUseofPedography.6.aspx. - -cited by applicant - - - -Leslie Klenerman, Bernard Wood, N.L. Griffin; The Human Foot: A Companion to Clinical Studies; Book; Jan. 31, 2006; Three Pages; Springer 2006 edition; http://www.amazon.com/The-Human-Foot-Companion-Clinical/dp/185233925X. - -cited by applicant - - - -J. Alexander, EY Chao, KA Johnson; The assessment of dynamic foot-to-ground contact forces and plantar pressure distribution: a review of the evolution of current techniques and clinical applications; Abstract; Dec. 1990; Two Pages; Foot Ankle. Dec. 1990, 11(3):152-67; http://www.ncbi.nlm.nih.gov/pubmed/2074083. - -cited by applicant - - - -Bijan Najafi, Elizabeth Barnica, James S. Wrobel, Joshua Burns; Dynamic plantar loading index: Understanding the benefit of custom foot orthoses for painful pes cavus; Journal; Jun. 1, 2012; Two Pages; Journal of Biomechanics, vol. 45, Issue 9, pp. 1705-1711; http://www.sciencedirect.com/science/article/pii/S0021929012001728. - -cited by applicant - - - -Cedric Morio, Mark J. Lake, Nils Gueguen, Guillaume Rao, Laurent Baly; The influence of footwear on foot motion during walking and running; Journal; Sep. 18, 2009; Two Pages; Journal of Biomechanics, vol. 42, Issue 13, pp. 2081-2088; http://www.sciencedirect.com/science/article/pii/S0021929009003376. - -cited by applicant - - - -Yan Cong, Jason Tak-Man Cheung, Aaron KL Leung, Ming Zhang; Effect of heel height on in-shoe localized triaxial stresses; Journal; Aug. 11, 2011; Two Pages; Journal of Biomechanics, vol. 44, Issue 12, pp. 2267-2272; http://www.sciencedirect.com/science/article/pii/S0021929011004301. - -cited by applicant - - - -Herbert Elftman; A cinematic study of the distribution of pressure in the human foot; Article; Feb. 3, 2005; Four Pages; The Anatomical Record, vol. 59, Issue 4, pp. 481-491, Jul. 1934; Copyright 1934 Wiley-Liss, Inc.; http://onlinelibrary.wiley.com/doi/10.1002/ar.1090590409/abstract. - -cited by applicant - - - -Margo N Orlin and Thomas G McPoil; Plantar Pressure Assessment; Article; Jul. 30, 2014; Thirteen Pages; Physical Therapy, Journal of the American Physical Therapy Association and de Fysiotherapeut Royal Dutch Society for Physical Therapy, Phys Ther.2000, 80:399-409; http://ptjournal.apta.org/content/80/4/399.full.pdf. - -cited by applicant - - - -Daniel Tik-Pui Fong, De-Wei Mao, Jing-Xian Li, Youlian Hong; Greater toe grip and gentler heel strike are the strategies to adapt to slippery surface; Journal; 2008; Two Pages; Journal of Biomechanics, vol. 41, Issue 4, pp. 838-844; http://www.sciencedirect.com/science/article/pii/S0021929007004708. - -cited by applicant - - - -Marilyn Lord; Foot pressure measurement: A review of methodology; Journal; Apr. 1981; Two Pages; Journal of Biomedical Engineering, vol. 3, Issue 2, pp. 91-99; http://www.sciencedirect.com/science/article/pii/0141542581900017. - -cited by applicant - - -1 -1 - - -US -D 2611 - - -US -D 2627 - - -US -D 2731 - - -US -D 2732 - - -US -D 2738 - - -US -D 2742 - - -US -D 2744 - - -US -D 2858 - - -US -D 2901 - - -US -D 2909-915 -unstructured - - -US -D 2919 - - -US -D 2920 - - -US -D 2947 - - -US -D 2961 - - -US -D 2964 - - -US -D 2965 - - -US -D 2967 - - -US -D 2968 - - -US -D 2969-971 -unstructured - - -US -D 2977 - - -US -D 2978 - - -US -D 2980 - - -US -D 2983-985 -unstructured - - -US -D 2994 - - -US -D24192 - - -US - 2 60 - - -US - 2 61 - - -US - 2 66 - - -US - 2 67 - - -US - 2 80 - - -US - 2170 - - -US - 2228 - - -US - 2237 - - -US - 2239-242 -unstructured - - -US - 2272 - - -US - 2407 - - -US - 24713 - - -US - 36 37 - - -US - 36 43 - - -US - 36 44 - -A41B 11/00 -A41D 1/08 -A41D 7/00 -A43B 13/00 -A43B 17/00 -A43B 17/003 -A43B 17/02 -A43B 17/10 -A43B 19/00 -A43C 1/00 -A43C 9/00 - - -4 -7 - - - - - -Psomas -George -
-New York -NY -US -
-
- -US - -
- - -Psomas -Nicole -
-Wyckoff -NJ -US -
-
- -US - -
-
- - - -Psomas -George -
-New York -NY -US -
-
-
- - -Psomas -Nicole -
-Wyckoff -NJ -US -
-
-
-
- - - -Goldstein Law Offices, P.C. -
-unknown -
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- - -Asch -Jeffrey D -2919 - - -Weiland -Dana K - - -
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FIG. 1 is a perspective view of a non-slip hosiery showing the upper portion of the hosiery in a worn position;

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FIG. 2 is a top plan view of a non-slip hosiery shown separately from the upper portion of the hosiery for ease of illustration;

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FIG. 3 is a bottom plan view thereof.

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FIG. 4 is a front elevational view thereof.

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FIG. 5 is a rear elevational view thereof.

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FIG. 6 is a right side elevational view thereof; and,

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FIG. 7 is a left side elevational view thereof.

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The broken lines shown in FIG. 1 represent the upper portion of the non-slip hosiery as environment and form no part of the claimed design.

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The double line around the outer edges in FIG. 2 represent the thickness of material. The interior contours shown in FIG. 2 follow the exterior contours shown throughout the views.

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- -
-CLAIM - - -The ornamental design for a non-slip hosiery, as shown and described. - - -
- - - - - - -US -D0724292 -S1 -20150317 - - - - -US -29435123 -20121019 - - -29 - -14 - - -10 -0202 - - -US -D 2847 - -Performance dress shirt - - - - -US -1949312 -A -Konski -19340200 - - -cited by examiner -US 2122 - - - - -US -2222090 -A -Schaumer -19401100 - - -cited by examiner -US 2113 - - - - -US -D187852 -S -Freund -19600500 - - -cited by examiner -USD 2849 - - - - -US -D263890 -S -Dalton -19820400 - - -cited by examiner -USD 2849 - - - - -US -D578736 -S -Lim -20081000 - - -cited by examiner -USD 2841 - - - - -US -D661055 -S -McKinley -20120600 - - -cited by examiner -USD 2840 - - - - -US -D668841 -S -McKinley -20121000 - - -cited by examiner -USD 2840 - - - - -US -2012/0047619 -A1 -Lambertz -20120300 - - -cited by examiner -US 2 69 - - - - -US -2012/0131733 -A1 -Mertz -20120500 - - -cited by examiner -US 2455 - - - - -FR -2891115 -A1 -20070300 - - -cited by examiner - - - -Outlier. http://shop.outlier.cc/shop/retail/air-forged-oxford.html. Date Unknown: Viewed Oct. 2014. “Outlier Pivot Sleeve”. - -cited by examiner - - -1 -1 - - -US -D 2700 - - -US -D 2706 - - -US -D 2708 - - -US -D 2717 - - -US -D 2749-751 -unstructured - - -US -D 2823 - - -US -D 2825 - - -US -D 2828-831 -unstructured - - -US -D 2839 - - -US -D 2840 - - -US -D 2841 - - -US -D 2847 - - -US -D 2849 - - -US -D 2858 - - -US - 2 84 - - -US - 2 88 - - -US - 2 90 - - -US - 2 93 - - -US - 2 96 - - -US - 2 98 - - -US - 2102 - - -US - 2106 - - -US - 2108 - - -US - 2109 - - -US - 2113 - - -US - 2115 - - -US - 2116 - - -US - 2122 - - -US - 2123 - - -US - 2124 - -A41D 1/02 -A41D 1/04 -A41D 1/18 -A41D 3/00 -A41D 3/005 -A41D 3/02 -A41D 3/04 -A41D 3/08 -A41D 13/0015 -A41D 13/05 - - -2 -4 - - - - - -Amarasiriwardena -Gihan S. -
-Boston -MA -US -
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- -US - -
- - -Obropta -Edward W. -
-Boston -MA -US -
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- -US - -
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- - - -Amarasiriwardena -Gihan S. -
-Boston -MA -US -
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-Boston -MA -US -
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-unknown -
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- - - -Ministry of Supply -02 -
-Boston -MA -US -
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FIG. 1 is a front view of a performance dress shirt.

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FIG. 2 is a rear view of the performance dress shirt of FIG. 1.

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FIG. 3 is a front perspective view of the performance dress shirt of FIG. 1; and,

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FIG. 4 is a rear perspective view of the performance dress shirt of FIG. 1.

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The broken lines shown throughout the views represent the portions of the performance dress shirt which form no part of the claimed design. The line shading shown in some areas and the stippling applied to other areas of the shirt represent a contrast in materials.

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-CLAIM - - -The ornamental design for a performance dress shirt, as shown and described. - - -
- - - - - - -US -D0724293 -S1 -20150317 - - - - -US -29443467 -20130117 - - -29 - - -EM -002075705-0004 -20120718 - - - -14 - - -10 -0202 - - -US -D 2853 - -Rivet - - - - -US -D406177 -S -Milroy -19990200 - - -cited by examiner -USD20 27 - - - - -US -D442113 -S -Nisguretsky -20010500 - - -cited by examiner -USD11 86 - - - - -US -D460857 -S -Milroy -20020700 - - -cited by examiner -USD 2976 - - - - -US -D557483 -S -Young et al. -20071200 - - -cited by examiner -USD 2946 - - - - -US -D629589 -S -Mayo -20101200 - - -cited by examiner -USD 2853 - - - - -US -D655493 -S -Kelley et al. -20120300 - - -cited by examiner -USD 2976 - - - - -US -D665987 -S -El et al. -20120800 - - -cited by examiner -USD 2976 - - - - -US -D675906 -S -Erickson -20130200 - - -cited by examiner -USD 8386 - - - - -US -D718655 -S -Fischer -20141200 - - -cited by examiner -USD11 86 - - - - -US -2013/0174314 -A1 -Candemir -20130700 - - -cited by examiner -US 2 69 - - - -Amazon. http://www.amazon.com/Bench-Waltzup-Jacket-Mens-Black/dp/B00JMBSN70/ref=sr12?s=apparel&ie=UTF8&qid=1420770569&sr=1-2. Date Unknown: Viewed Jan. 2015. “Bench Waltzup Jacket—Men's”. - -cited by examiner - - - -Handmade Jewelry Tutor. http://handmadejewelrytutor.com/page/2/. Jul. 2012. “Butterfly Pendant Riveting Tutorial”. - -cited by examiner - - - -Etsy. https://www.etsy.com/listing/152701277/vintage-square-shape-flat-head-rivet?ref=market. Nov. 2014. “Vintage Square Shape Flat Head Rivet Studs,Clothing Studs,Bags Studs,Hat studs,Shoes Studs,Clothing Buttons”. - -cited by examiner - - - -Americana International Limited (owner), U.S. Trademark Registration No. 3,960,630 registered on May 17, 2011. - -cited by applicant - - - -Americana International Limited (owner), U.S. Trademark Registration No. 3,956,390 registered on May 10, 2011. - -cited by applicant - - - -Americana International Limited (owner), U.S. Trademark Registration No. 4,048,167 registered on Nov. 1, 2011. - -cited by applicant - - -1 -1 - - -US -D 2717 - - -US -D 2749 - - -US -D 2750 - - -US -D 2840 - - -US -D 2853 - - -US -D 2976 - - -US - 2106 - - -US - 2108 - - -US - 2115 - - -US -D21484 - - -US -D 8386 - - -US -D11200 - - -US -D11 86 - - -US -411501 - - - -2 -7 - - - - - -Barber -Nick -
-Manchester -GB -
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- -GB - -
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-Manchester -GB -
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-unknown -
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- - -Apolzon, Esq. -Lawrence E. -
-unknown -
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-Manchester -GB -
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FIG. 1 is a front perspective view of a rivet showing my design;

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FIG. 2 is a bottom view of the rivet shown in FIG. 1;

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FIG. 3 a front view of the rivet shown in FIG. 1;

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FIG. 4 a rear view of the rivet shown in FIG. 1;

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FIG. 5 is a left side view of the rivet shown in FIG. 1;

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FIG. 6 is a right side view of the rivet shown in FIG. 1; and,

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FIG. 7 is a top view of the rivet shown in FIG. 1.

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-CLAIM - - -The ornamental design for a rivet, as shown and described. - - -
- - - - - - -US -D0724294 -S1 -20150317 - - - - -US -29456120 -20130529 - - -29 - -14 - - -10 -0203 - - -US -D 2882 - -Sports cap - - - - -US -D136649 -S -Dannenberg -19431100 - - -cited by examiner -USD 2879 - - - - -US -2888681 -A -Stuart et al. -19590600 - - -cited by examiner -US 2 66 - - - - -US -3245087 -A -Marchello -19660400 - - -cited by examiner -US 2422 - - - - -US -3471865 -A -Molitoris -19691000 - - -cited by examiner -US 2423 - - - - -US -D242088 -S -Durand et al. -19761100 - - -cited by examiner -USD29105 - - - - -US -D266711 -S -Gooding -19821100 - - -cited by examiner -USD29105 - - - - -US -D267831 -S -Sucato -19830200 - - -cited by examiner -USD 2865 - - - - -US -4599752 -A -Mitchell -19860700 - - -cited by examiner -US 2425 - - - - -US -5119514 -A -Woehl -19920600 - - -cited by examiner -US 2172 - - - - -US -D361407 -S -Ho -19950800 - - -cited by examiner -USD29102 - - - - -US -5701610 -A -Hsu -19971200 - - -cited by examiner -US 2425 - - - - -US -D454678 -S -Graves et al. -20020300 - - -cited by examiner -USD 2872 - - - - -US -D498572 -S -Si -20041100 - - -cited by examiner -USD 2882 - - - - -US -6880269 -B2 -Falone et al. -20050400 - - -cited by examiner -US 36 44 - - - - -US -D535460 -S -Ortley et al. -20070100 - - -cited by examiner -USD 2882 - - - - -US -D539488 -S -Phillips et al. -20070300 - - -cited by examiner -USD30145 - - - - -US -D557479 -S -McGrath -20071200 - - -cited by examiner -USD 2882 - - - - -US -D559468 -S -Broeckl -20080100 - - -cited by examiner -USD29105 - - - - -US -D584031 -S -Grandfield -20090100 - - -cited by examiner -USD 2882 - - - - -US -D586087 -S -Henf -20090200 - - -cited by examiner -USD 2879 - - - - -US -D589236 -S -Henf -20090300 - - -cited by examiner -USD 2879 - - - - -US -D618446 -S -Clare et al. -20100600 - - -cited by examiner -USD 2878 - - - - -US -D641961 -S -Kim -20110700 - - -cited by examiner -USD 2882 - - - - -US -D684754 -S -Kim -20130600 - - -cited by examiner -USD 2882 - - - - -US -2004/0231032 -A1 -Park -20041100 - - -cited by examiner -US 21951 - - - - -US -2007/0130670 -A1 -Henf -20070600 - - -cited by examiner -US 21951 - - - - -US -2013/0191974 -A1 -Lebel et al. -20130800 - - -cited by examiner -US 2423 - - - - -EM -001143069-0003 -20090700 - - -cited by examiner - - - - -KR -300548776.0000 -20091200 - - -cited by examiner - - - - -KR -300688392.0000 -20130400 - - -cited by examiner - - -1 -1 - - -US -D 2865 - - -US -D 2866 - - -US -D 2868 - - -US -D 2869 - - -US -D 2870 - - -US -D 2871 - - -US -D 2872 - - -US -D 2873 - - -US -D 2874 - - -US -D 2878 - - -US -D 2879 - - -US -D 2880 - - -US -D 2881 - - -US -D 2882 - - -US -D 2889 - - -US -D 2892 - - -US -D 2867 - - -US -D 2891 - - -US -D 2884 - - -US -D 2890 - - -US -D 2894 - - -US -D 2895 - - -US -D 2875 - - -US -D 2876 - - -US -D 2877 - - -US -D 2886 - - -US -D 2893 - - -US -D29102 - - -US -D29103 - - -US -D29104 - - -US -D29105 - - -US -D29106 - - -US -D29107 - - -US -D29108 - - -US -D29109 - - -US -D29110 - - -US -D29111 - - -US -D29122 - - -US -D29100 - - -US - 2 84 - - -US - 2171 - - -US - 22001 - - -US - 2202 - - -US - 2203 - - -US - 2204 - - -US - 2205 - - -US - 2206 - - -US - 220913 - - -US - 2411 - - -US - 21711 - - -US - 21754 - - -US - 21951 - - -US - 21952 - - -US - 21953 - - -US - 21954 - - -US - 21955 - - -US - 220911 - - -US - 220912 - - -US - 22093 - - -US - 217102 - - -US - 2172 - - -US - 21956 - - -US - 22095 - - -US - 22097 - - -US - 2410 - - -US - 2420 - - -US - 2425 - - -US - 2181 - - -US - 21814 - - -US - 21816 - - -US - 21828 - - -US - 2 68 - - -US - 21751 - - -US - 21752 - - -US - 21753 - - -US - 21812 - - -US - 21818 - - -US - 21821 - - -US - 21822 - - -US - 21823 - - -US - 21824 - - -US - 21825 - - -US - 21826 - - -US - 21827 - - -US - 2183 - - -US - 21957 - - -US - 21958 - - -US - 22094 - -A42B 3/16 - - -21 -21 - - - - - -Matscitechno Licensing Company -
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FIG. 1 is a front/bottom perspective view of the first embodiment of a sports cap;

-

FIG. 2 is a right side elevation view thereof;

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FIG. 3 is a front elevation view thereof;

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FIG. 4 is a left side elevation view thereof;

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FIG. 5 is a rear elevation view thereof;

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FIG. 6 is a top plan view thereof; and

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FIG. 7 is a bottom plan view thereof;

-

FIG. 8 is a front/bottom perspective view of a second embodiment of a sports cap;

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FIG. 9 is a right side elevation view thereof;

-

FIG. 10 is a front elevation view thereof;

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FIG. 11 is a left side elevation view thereof;

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FIG. 12 is a rear elevation view thereof;

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FIG. 13 is a top plan view thereof; and

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FIG. 14 is a bottom plan view thereof;

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FIG. 15 is a front/bottom perspective view of a third embodiment of a sports cap;

-

FIG. 16 is a right side elevation view thereof;

-

FIG. 17 is a front elevation view thereof;

-

FIG. 18 is a left side elevation view thereof;

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FIG. 19 is a rear elevation view thereof;

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FIG. 20 is a top plan view thereof; and,

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FIG. 21 is a bottom plan view thereof.

-

The portions of the sports cap and partial human figure shown in broken lines depict environmental subject matter only and form no part of the claimed design.

-
- -
-CLAIM - - -The ornamental design for a sports cap, as shown and described. - - -
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-Rockford -MI -US -
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- -US - -
-
- - - -Dodge -Wilson S. -
-Grand Rapids -MI -US -
-
-
- - -Bohnsack -Shaun M. -
-Grand Rapids -MI -US -
-
-
- - -Matis -Clark A. -
-Durango -CO -US -
-
-
- - -Loveder -Christopher J. -
-Rockford -MI -US -
-
-
-
- - - -Warner Norcross & Judd LLP -
-unknown -
-
-
-
-
- - - -Wolverine World Wide, Inc. -02 -
-Rockford -MI -US -
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-
-
- - -Nelson -T. Chase -2914 - - -
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FIG. 1 is a perspective view of the footwear sole embodying the new design;

-

FIG. 2 is a bottom plan view thereof;

-

FIG. 3 is a right side elevational view thereof;

-

FIG. 4 is a left side elevational view thereof;

-

FIG. 5 is a front elevational view thereof; and,

-

FIG. 6 is a rear elevational view thereof.

-

FIGS. 1-6 show features of the footwear in phantom lines. These features are shown for environmental purposes, and do not form any part of the claimed design. Furthermore, the phantom lines around the perimeter, and immediately adjacent to the solid-line portion of the design, form the boundary of the design, with the phantom lines forming no part of the claimed design.

-
- -
-CLAIM - - -The ornamental design for footwear sole, as shown and described. - - -
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-
- -US - -
- - -Delaleu -Jerry -
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-
- -US - -
-
- - - -Law -Nicholas Joseph -
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-
-
- - -Delaleu -Jerry -
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-
-
-
- - - -McAndrews Held & Malloy, Ltd. -
-unknown -
-
-
-
-
- - - -Sears Brands, L.L.C. -02 -
-Hoffman Estates -IL -US -
-
-
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- - -Nelson -T. Chase -2914 - - -
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FIG. 1 is a bottom front perspective view of a shoe outsole showing the new design;

-

FIG. 2 is a bottom plan view thereof;

-

FIG. 3 is a right side elevational view thereof;

-

FIG. 4 is a left side elevational view thereof;

-

FIG. 5 is a front side view thereof; and,

-

FIG. 6 is a rear side view thereof.

-

Any elements shown in dotted lines are provided for purposes of illustrating portions of the shoe outsole that form no part of the claimed design.

-
- -
-CLAIM - - -What is claimed is the ornamental design for a shoe outsole, as shown and described. - - -
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-Morristown -NJ -US -
-
- -US - -
-
- - - -Oliver -Andrew Wilson -
-Victoria -AU -
-
-
-
- - - -Thompson Patent Law -
-unknown -
-
-
- - -Thompson -Craige -
-unknown -
-
-
-
-
- - - -Honeywell International Inc. -02 -
-Morristown -NJ -US -
-
-
-
- - -Nelson -T. Chase -2914 - - -
- -
-embedded image -
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-
-embedded image -
-
-embedded image -
-
- - - -

FIG. 1 is an front perspective view of a shoe outsole showing the new design;

-

FIG. 2 is a plan view of the shoe outsole of FIG. 1;

-

FIG. 3 is a front view of the shoe outsole of FIG. 1; and,

-

FIG. 4 is a rear view of the shoe outsole of FIG. 1.

-

FIG. 5 is a left side view of the shoe outsole of FIG. 1; and,

-

FIG. 6 is a right side view of the shoe outsole of FIG. 1.

-

The broken lines shown in the drawings illustrate environmental structure associated with the shoe outsole in a condition of use. The broken lines and structures they depict form no part of the claimed design.

-
- -
-CLAIM - - -The ornamental design for a shoe outsole, as shown and described. - - -
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Available from Internet, URL: <http://www.sockdreams.com/products/professional-fishnet-tights-with-cotton-sole:11749>. - -cited by examiner - - - -Kushyfoot Tights and Flats-To-Go, announced Jan. 4, 2012 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.thanksmailcarrier.com/2012/01/kushyfoot-tights-and-flats-to-go-review.html>. - -cited by examiner - - - -HUE Women's 3-Pack Micro Net Liner, announced Jun. 25, 2011 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.amazon.com/HUE-Womens-3-Pack-Micro-Liner/dp/B002JM0S5O>. - -cited by examiner - - - -Sure-Grip Terrycloth Slippers, announced Nov. 18, 2011 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.medline.com/jump/product/x/Z05-PF02319>. - -cited by examiner - - - -Springer Link; A study of the distribution of load under the normal foot during walking; Article; Oct. 1979; Three Pages; International Orthopaedics, vol. 3, Issue 2, pp. 153-157; http://link.springer.com/article/10.1007/BF00266887. - -cited by applicant - - - -D. Rosenbaum and H.P. Becker; Plantar pressure distribution measurements. Technical background and clinical applications; Oct. 30, 2003; Two Pages; 1997 Blackwell Science Ltd., Foot and Ankle Surgery, vol. 3, Issue 1, pp. 1-24, Mar. 1997; http://onlinelibrary.wiley.com/doi/10.1046/j.1460-9584.1997.00043.x/abstract. - -cited by applicant - - - -Amit Gefen, PhD; Pressure-Sensing Devices for Assessment of Soft Tissue Loading Under Bony Prominences: Technological Concepts and Clinical U; Dec. 12, 2007; Twelve Pages; vol. 19—Issue 12—Dec. 2007 (/issue/78); http://www.woundsresearch.com/article/8106. - -cited by applicant - - - -Martinus Richter, Michael Frink, Stefan Zech, Jens Geerling, Patrizia Droste, Karsten Knobloch, Christian Krettek; Technique for Intraoperative Use of Pedography; Journal; Jun. 2006; One Page; Techniques in Foot & Ankle Surgery: Jun. 2006—vol. 5—Issue 2—pp. 88-100; http://journals.lww.com/techfootankle/Abstract/2006/06000/TechniqueforIntraoperativeUseofPedography.6.aspx. - -cited by applicant - - - -Leslie Klenerman, Bernard Wood, N.L. Griffin; The Human Foot: A Companion to Clinical Studies; Book; Jan. 31, 2006; Three Pages; Springer 2006 edition; http://www.amazon.com/The-Human-Foot-Companion-Clinical/dp/185233925X. - -cited by applicant - - - -J. Alexander, EY Chao, KA Johnson; The assessment of dynamic foot-to-ground contact forces and plantar pressure distribution: a review of the evolution of current techniques and clinical applications; Abstract; Dec. 1990; Two Pages; Foot Ankle. Dec. 1990, 11(3):152-67; http://www.ncbi.nlm.nih.gov/pubmed/2074083. - -cited by applicant - - - -Bijan Najafi, Elizabeth Barnica, James S. Wrobel, Joshua Burns; Dynamic plantar loading index: Understanding the benefit of custom foot orthoses for painful pes cavus; Journal; Jun. 1, 2012; Two Pages; Journal of Biomechanics, vol. 45, Issue 9, pp. 1705-1711; http://www.sciencedirect.com/science/article/pii/S0021929012001728. - -cited by applicant - - - -Cedric Morio, Mark J. Lake, Nils Gueguen, Guillaume Rao, Laurent Baly; The influence of footwear on foot motion during walking and running; Journal; Sep. 18, 2009; Two Pages; Journal of Biomechanics, vol. 42, Issue 13, pp. 2081-2088; http://www.sciencedirect.com/science/article/pii/S0021929009003376. - -cited by applicant - - - -Yan Cong, Jason Tak-Man Cheung, Aaron KL Leung, Ming Zhang; Effect of heel height on in-shoe localized triaxial stresses; Journal; Aug. 11, 2011; Two Pages; Journal of Biomechanics, vol. 44, Issue 12, pp. 2267-2272; http://www.sciencedirect.com/science/article/pii/S0021929011004301. - -cited by applicant - - - -Herbert Elftman; A cinematic study of the distribution of pressure in the human foot; Article; Feb. 3, 2005; Four Pages; The Anatomical Record, vol. 59, Issue 4, pp. 481-491, Jul. 1934; Copyright 1934 Wiley-Liss, Inc.; http://onlinelibrary.wiley.com/doi/10.1002/ar.1090590409/abstract. - -cited by applicant - - - -Margo N Orlin and Thomas G McPoil; Plantar Pressure Assessment; Article; Jul. 30, 2014; Thirteen Pages; Physical Therapy, Journal of the American Physical Therapy Association and de Fysiotherapeut Royal Dutch Society for Physical Therapy, Phys Ther.2000, 80:399-409; http://ptjournal.apta.org/content/80/4/399.full.pdf. - -cited by applicant - - - -Daniel Tik-Pui Fong, De-Wei Mao, Jing-Xian Li, Youlian Hong; Greater toe grip and gentler heel strike are the strategies to adapt to slippery surface; Journal; 2008; Two Pages; Journal of Biomechanics, vol. 41, Issue 4, pp. 838-844; http://www.sciencedirect.com/science/article/pii/S0021929007004708. - -cited by applicant - - - -Marilyn Lord; Foot pressure measurement: A review of methodology; Journal; Apr. 1981; Two Pages; Journal of Biomedical Engineering, vol. 3, Issue 2, pp. 91-99; http://www.sciencedirect.com/science/article/pii/0141542581900017. - -cited by applicant - - -1 -1 - - -US -D 2611 - - -US -D 2627 - - -US -D 2731 - - -US -D 2732 - - -US -D 2738 - - -US -D 2742 - - -US -D 2744 - - -US -D 2858 - - -US -D 2901 - - -US -D 2909-915 -unstructured - - -US -D 2919 - - -US -D 2920 - - -US -D 2947 - - -US -D 2961 - - -US -D 2964 - - -US -D 2965 - - -US -D 2967 - - -US -D 2968 - - -US -D 2969-971 -unstructured - - -US -D 2977 - - -US -D 2978 - - -US -D 2980 - - -US -D 2983-985 -unstructured - - -US -D 2994 - - -US -D24192 - - -US - 2 60 - - -US - 2 61 - - -US - 2 66 - - -US - 2 67 - - -US - 2 80 - - -US - 2170 - - -US - 2228 - - -US - 2237 - - -US - 2239-242 -unstructured - - -US - 2272 - - -US - 2407 - - -US - 24713 - - -US - 36 37 - - -US - 36 43 - - -US - 36 44 - -A41B 11/00 -A41D 1/08 -A41D 7/00 -A43B 13/00 -A43B 17/00 -A43B 17/003 -A43B 17/02 -A43B 17/10 -A43B 19/00 -A43C 1/00 -A43C 9/00 - - -4 -7 - - - - - -Psomas -George -
-New York -NY -US -
-
- -US - -
- - -Psomas -Nicole -
-Wyckoff -NJ -US -
-
- -US - -
-
- - - -Psomas -George -
-New York -NY -US -
-
-
- - -Psomas -Nicole -
-Wyckoff -NJ -US -
-
-
-
- - - -Goldstein Law Offices, P.C. -
-unknown -
-
-
-
-
- - -Asch -Jeffrey D -2919 - - -Weiland -Dana K - - -
- -
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FIG. 1 is a perspective view of a non-slip hosiery showing the upper portion of the hosiery in a worn position;

-

FIG. 2 is a top plan view of a non-slip hosiery shown separately from the upper portion of the hosiery for ease of illustration;

-

FIG. 3 is a bottom plan view thereof.

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FIG. 4 is a front elevational view thereof.

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FIG. 5 is a rear elevational view thereof.

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FIG. 6 is a right side elevational view thereof; and,

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FIG. 7 is a left side elevational view thereof.

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The broken lines shown in FIG. 1 represent the upper portion of the non-slip hosiery as environment and form no part of the claimed design.

-

The double line around the outer edges in FIG. 2 represent the thickness of material. The interior contours shown in FIG. 2 follow the exterior contours shown throughout the views.

-
- -
-CLAIM - - -The ornamental design for a non-slip hosiery, as shown and described. - - -
- - - - - - -US -D0724292 -S1 -20150317 - - - - -US -29435123 -20121019 - - -29 - -14 - - -10 -0202 - - -US -D 2847 - -Performance dress shirt - - - - -US -1949312 -A -Konski -19340200 - - -cited by examiner -US 2122 - - - - -US -2222090 -A -Schaumer -19401100 - - -cited by examiner -US 2113 - - - - -US -D187852 -S -Freund -19600500 - - -cited by examiner -USD 2849 - - - - -US -D263890 -S -Dalton -19820400 - - -cited by examiner -USD 2849 - - - - -US -D578736 -S -Lim -20081000 - - -cited by examiner -USD 2841 - - - - -US -D661055 -S -McKinley -20120600 - - -cited by examiner -USD 2840 - - - - -US -D668841 -S -McKinley -20121000 - - -cited by examiner -USD 2840 - - - - -US -2012/0047619 -A1 -Lambertz -20120300 - - -cited by examiner -US 2 69 - - - - -US -2012/0131733 -A1 -Mertz -20120500 - - -cited by examiner -US 2455 - - - - -FR -2891115 -A1 -20070300 - - -cited by examiner - - - -Outlier. http://shop.outlier.cc/shop/retail/air-forged-oxford.html. Date Unknown: Viewed Oct. 2014. “Outlier Pivot Sleeve”. - -cited by examiner - - -1 -1 - - -US -D 2700 - - -US -D 2706 - - -US -D 2708 - - -US -D 2717 - - -US -D 2749-751 -unstructured - - -US -D 2823 - - -US -D 2825 - - -US -D 2828-831 -unstructured - - -US -D 2839 - - -US -D 2840 - - -US -D 2841 - - -US -D 2847 - - -US -D 2849 - - -US -D 2858 - - -US - 2 84 - - -US - 2 88 - - -US - 2 90 - - -US - 2 93 - - -US - 2 96 - - -US - 2 98 - - -US - 2102 - - -US - 2106 - - -US - 2108 - - -US - 2109 - - -US - 2113 - - -US - 2115 - - -US - 2116 - - -US - 2122 - - -US - 2123 - - -US - 2124 - -A41D 1/02 -A41D 1/04 -A41D 1/18 -A41D 3/00 -A41D 3/005 -A41D 3/02 -A41D 3/04 -A41D 3/08 -A41D 13/0015 -A41D 13/05 - - -2 -4 - - - - - -Amarasiriwardena -Gihan S. -
-Boston -MA -US -
-
- -US - -
- - -Obropta -Edward W. -
-Boston -MA -US -
-
- -US - -
-
- - - -Amarasiriwardena -Gihan S. -
-Boston -MA -US -
-
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- - -Obropta -Edward W. -
-Boston -MA -US -
-
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- - - -Goodwin Procter LLP -
-unknown -
-
-
-
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- - - -Ministry of Supply -02 -
-Boston -MA -US -
-
-
-
- - -Johnson -Rashida -2916 - - -
- -
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FIG. 1 is a front view of a performance dress shirt.

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FIG. 2 is a rear view of the performance dress shirt of FIG. 1.

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FIG. 3 is a front perspective view of the performance dress shirt of FIG. 1; and,

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FIG. 4 is a rear perspective view of the performance dress shirt of FIG. 1.

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The broken lines shown throughout the views represent the portions of the performance dress shirt which form no part of the claimed design. The line shading shown in some areas and the stippling applied to other areas of the shirt represent a contrast in materials.

-
- -
-CLAIM - - -The ornamental design for a performance dress shirt, as shown and described. - - -
- - - - - - -US -D0724293 -S1 -20150317 - - - - -US -29443467 -20130117 - - -29 - - -EM -002075705-0004 -20120718 - - - -14 - - -10 -0202 - - -US -D 2853 - -Rivet - - - - -US -D406177 -S -Milroy -19990200 - - -cited by examiner -USD20 27 - - - - -US -D442113 -S -Nisguretsky -20010500 - - -cited by examiner -USD11 86 - - - - -US -D460857 -S -Milroy -20020700 - - -cited by examiner -USD 2976 - - - - -US -D557483 -S -Young et al. -20071200 - - -cited by examiner -USD 2946 - - - - -US -D629589 -S -Mayo -20101200 - - -cited by examiner -USD 2853 - - - - -US -D655493 -S -Kelley et al. -20120300 - - -cited by examiner -USD 2976 - - - - -US -D665987 -S -El et al. -20120800 - - -cited by examiner -USD 2976 - - - - -US -D675906 -S -Erickson -20130200 - - -cited by examiner -USD 8386 - - - - -US -D718655 -S -Fischer -20141200 - - -cited by examiner -USD11 86 - - - - -US -2013/0174314 -A1 -Candemir -20130700 - - -cited by examiner -US 2 69 - - - -Amazon. http://www.amazon.com/Bench-Waltzup-Jacket-Mens-Black/dp/B00JMBSN70/ref=sr12?s=apparel&ie=UTF8&qid=1420770569&sr=1-2. Date Unknown: Viewed Jan. 2015. “Bench Waltzup Jacket—Men's”. - -cited by examiner - - - -Handmade Jewelry Tutor. http://handmadejewelrytutor.com/page/2/. Jul. 2012. “Butterfly Pendant Riveting Tutorial”. - -cited by examiner - - - -Etsy. https://www.etsy.com/listing/152701277/vintage-square-shape-flat-head-rivet?ref=market. Nov. 2014. “Vintage Square Shape Flat Head Rivet Studs,Clothing Studs,Bags Studs,Hat studs,Shoes Studs,Clothing Buttons”. - -cited by examiner - - - -Americana International Limited (owner), U.S. Trademark Registration No. 3,960,630 registered on May 17, 2011. - -cited by applicant - - - -Americana International Limited (owner), U.S. Trademark Registration No. 3,956,390 registered on May 10, 2011. - -cited by applicant - - - -Americana International Limited (owner), U.S. Trademark Registration No. 4,048,167 registered on Nov. 1, 2011. - -cited by applicant - - -1 -1 - - -US -D 2717 - - -US -D 2749 - - -US -D 2750 - - -US -D 2840 - - -US -D 2853 - - -US -D 2976 - - -US - 2106 - - -US - 2108 - - -US - 2115 - - -US -D21484 - - -US -D 8386 - - -US -D11200 - - -US -D11 86 - - -US -411501 - - - -2 -7 - - - - - -Barber -Nick -
-Manchester -GB -
-
- -GB - -
-
- - - -Barber -Nick -
-Manchester -GB -
-
-
-
- - - -Fross Zelnick Lehrman & Zissu, P.C. -
-unknown -
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- - -Apolzon, Esq. -Lawrence E. -
-unknown -
-
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- - - -Americana International Limited -03 -
-Manchester -GB -
-
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- - -Johnson -Rashida -2916 - - -
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FIG. 1 is a front perspective view of a rivet showing my design;

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FIG. 2 is a bottom view of the rivet shown in FIG. 1;

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FIG. 3 a front view of the rivet shown in FIG. 1;

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FIG. 4 a rear view of the rivet shown in FIG. 1;

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FIG. 5 is a left side view of the rivet shown in FIG. 1;

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FIG. 6 is a right side view of the rivet shown in FIG. 1; and,

-

FIG. 7 is a top view of the rivet shown in FIG. 1.

-
- -
-CLAIM - - -The ornamental design for a rivet, as shown and described. - - -
- - - - - - -US -D0724294 -S1 -20150317 - - - - -US -29456120 -20130529 - - -29 - -14 - - -10 -0203 - - -US -D 2882 - -Sports cap - - - - -US -D136649 -S -Dannenberg -19431100 - - -cited by examiner -USD 2879 - - - - -US -2888681 -A -Stuart et al. -19590600 - - -cited by examiner -US 2 66 - - - - -US -3245087 -A -Marchello -19660400 - - -cited by examiner -US 2422 - - - - -US -3471865 -A -Molitoris -19691000 - - -cited by examiner -US 2423 - - - - -US -D242088 -S -Durand et al. -19761100 - - -cited by examiner -USD29105 - - - - -US -D266711 -S -Gooding -19821100 - - -cited by examiner -USD29105 - - - - -US -D267831 -S -Sucato -19830200 - - -cited by examiner -USD 2865 - - - - -US -4599752 -A -Mitchell -19860700 - - -cited by examiner -US 2425 - - - - -US -5119514 -A -Woehl -19920600 - - -cited by examiner -US 2172 - - - - -US -D361407 -S -Ho -19950800 - - -cited by examiner -USD29102 - - - - -US -5701610 -A -Hsu -19971200 - - -cited by examiner -US 2425 - - - - -US -D454678 -S -Graves et al. -20020300 - - -cited by examiner -USD 2872 - - - - -US -D498572 -S -Si -20041100 - - -cited by examiner -USD 2882 - - - - -US -6880269 -B2 -Falone et al. -20050400 - - -cited by examiner -US 36 44 - - - - -US -D535460 -S -Ortley et al. -20070100 - - -cited by examiner -USD 2882 - - - - -US -D539488 -S -Phillips et al. -20070300 - - -cited by examiner -USD30145 - - - - -US -D557479 -S -McGrath -20071200 - - -cited by examiner -USD 2882 - - - - -US -D559468 -S -Broeckl -20080100 - - -cited by examiner -USD29105 - - - - -US -D584031 -S -Grandfield -20090100 - - -cited by examiner -USD 2882 - - - - -US -D586087 -S -Henf -20090200 - - -cited by examiner -USD 2879 - - - - -US -D589236 -S -Henf -20090300 - - -cited by examiner -USD 2879 - - - - -US -D618446 -S -Clare et al. -20100600 - - -cited by examiner -USD 2878 - - - - -US -D641961 -S -Kim -20110700 - - -cited by examiner -USD 2882 - - - - -US -D684754 -S -Kim -20130600 - - -cited by examiner -USD 2882 - - - - -US -2004/0231032 -A1 -Park -20041100 - - -cited by examiner -US 21951 - - - - -US -2007/0130670 -A1 -Henf -20070600 - - -cited by examiner -US 21951 - - - - -US -2013/0191974 -A1 -Lebel et al. -20130800 - - -cited by examiner -US 2423 - - - - -EM -001143069-0003 -20090700 - - -cited by examiner - - - - -KR -300548776.0000 -20091200 - - -cited by examiner - - - - -KR -300688392.0000 -20130400 - - -cited by examiner - - -1 -1 - - -US -D 2865 - - -US -D 2866 - - -US -D 2868 - - -US -D 2869 - - -US -D 2870 - - -US -D 2871 - - -US -D 2872 - - -US -D 2873 - - -US -D 2874 - - -US -D 2878 - - -US -D 2879 - - -US -D 2880 - - -US -D 2881 - - -US -D 2882 - - -US -D 2889 - - -US -D 2892 - - -US -D 2867 - - -US -D 2891 - - -US -D 2884 - - -US -D 2890 - - -US -D 2894 - - -US -D 2895 - - -US -D 2875 - - -US -D 2876 - - -US -D 2877 - - -US -D 2886 - - -US -D 2893 - - -US -D29102 - - -US -D29103 - - -US -D29104 - - -US -D29105 - - -US -D29106 - - -US -D29107 - - -US -D29108 - - -US -D29109 - - -US -D29110 - - -US -D29111 - - -US -D29122 - - -US -D29100 - - -US - 2 84 - - -US - 2171 - - -US - 22001 - - -US - 2202 - - -US - 2203 - - -US - 2204 - - -US - 2205 - - -US - 2206 - - -US - 220913 - - -US - 2411 - - -US - 21711 - - -US - 21754 - - -US - 21951 - - -US - 21952 - - -US - 21953 - - -US - 21954 - - -US - 21955 - - -US - 220911 - - -US - 220912 - - -US - 22093 - - -US - 217102 - - -US - 2172 - - -US - 21956 - - -US - 22095 - - -US - 22097 - - -US - 2410 - - -US - 2420 - - -US - 2425 - - -US - 2181 - - -US - 21814 - - -US - 21816 - - -US - 21828 - - -US - 2 68 - - -US - 21751 - - -US - 21752 - - -US - 21753 - - -US - 21812 - - -US - 21818 - - -US - 21821 - - -US - 21822 - - -US - 21823 - - -US - 21824 - - -US - 21825 - - -US - 21826 - - -US - 21827 - - -US - 2183 - - -US - 21957 - - -US - 21958 - - -US - 22094 - -A42B 3/16 - - -21 -21 - - - - - -Matscitechno Licensing Company -
-Kennett Square -PA -US -
-
- -US - -
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- - - -Vito -Robert A -
-Kennett Square -PA -US -
-
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- - - -RatnerPrestia -
-unknown -
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- - - -Matscitechno Licensing Company -02 -
-Kennett Square -PA -US -
-
-
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- - -Eldridge Powers -Karen E. -2921 - - -Barnes -Kimberly - - -
- -
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FIG. 1 is a front/bottom perspective view of the first embodiment of a sports cap;

-

FIG. 2 is a right side elevation view thereof;

-

FIG. 3 is a front elevation view thereof;

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FIG. 4 is a left side elevation view thereof;

-

FIG. 5 is a rear elevation view thereof;

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FIG. 6 is a top plan view thereof; and

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FIG. 7 is a bottom plan view thereof;

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FIG. 8 is a front/bottom perspective view of a second embodiment of a sports cap;

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FIG. 9 is a right side elevation view thereof;

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FIG. 10 is a front elevation view thereof;

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FIG. 11 is a left side elevation view thereof;

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FIG. 12 is a rear elevation view thereof;

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FIG. 13 is a top plan view thereof; and

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FIG. 14 is a bottom plan view thereof;

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FIG. 15 is a front/bottom perspective view of a third embodiment of a sports cap;

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FIG. 16 is a right side elevation view thereof;

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FIG. 17 is a front elevation view thereof;

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FIG. 18 is a left side elevation view thereof;

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FIG. 19 is a rear elevation view thereof;

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FIG. 20 is a top plan view thereof; and,

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FIG. 21 is a bottom plan view thereof.

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The portions of the sports cap and partial human figure shown in broken lines depict environmental subject matter only and form no part of the claimed design.

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- -
-CLAIM - - -The ornamental design for a sports cap, as shown and described. - - -
- - - - - - -US -D0724295 -S1 -20150317 - - - - -US -29453762 -20130502 - - -29 - -14 - - -10 -0204 - - -US -D 2954 - D2951 - D2955 - D2957 - D2953 - D2960 - -Footwear sole - - - - -US -1433309 -A -Stimpson -19221000 - - -cited by examiner -US 36 81 - - - - -US -D247831 -S -Famolare, Jr. -19780500 - - -cited by examiner -USD 2955 - - - - -US -D256179 -S -Famolare, Jr. -19800800 - - -cited by examiner -USD 2955 - - - - -US -D262327 -S -Foster -19811200 - - -cited by examiner -USD 2955 - - - - -US -D266967 -S -Inohara -19821100 - - -cited by examiner -USD 2953 - - - - -US -D395339 -S -Gray -19980600 - - -cited by examiner -USD 2954 - - - - -US -D399041 -S -Teague -19981000 - - -cited by examiner -USD 2954 - - - - -US -D401746 -S -Brooks et al. -19981200 - - -cited by examiner -USD 2960 - - - - -US -D410325 -S -Favreau et al. -19990600 - - -cited by examiner -USD 2954 - - - - -US -D447616 -S -Bandini et al. -20010900 - - -cited by applicant - - - - -US -D448544 -S -Della Valle -20011000 - - -cited by examiner -USD 2954 - - - - -US -6354022 -B2 -Gelsomini -20020300 - - -cited by examiner -US 36127 - - - - -US -D467061 -S -Della Valle -20021200 - - -cited by examiner -USD 2954 - - - - -US -D468081 -S -Recchi et al. -20030100 - - -cited by examiner -USD 2954 - - - - -US -D481200 -S -Belley et al. -20031000 - - -cited by applicant - - - - -US -D481526 -S -Matis et al. -20031100 - - -cited by applicant - - - - -US -D481527 -S -Matis et al. -20031100 - - -cited by examiner -USD 2955 - - - - -US -D481854 -S -Belley et al. -20031100 - - -cited by applicant - - - - -US -D489883 -S -McClaskie -20040500 - - -cited by examiner -USD 2954 - - - - -US -D490224 -S -McClaskie -20040500 - - -cited by examiner -USD 2954 - - - - -US -D496778 -S -Le -20041000 - - -cited by applicant - - - - -US -D549934 -S -Horne et al. -20070900 - - -cited by applicant - - - - -US -D549935 -S -Schoenborn et al. -20070900 - - -cited by applicant - - - - -US -D550439 -S -Belley et al. -20070900 - - -cited by applicant - - - - -US -D550440 -S -Matis et al. -20070900 - - -cited by applicant - - - - -US -D551434 -S -Nakano -20070900 - - -cited by examiner -USD 2955 - - - - -US -D560887 -S -Belley -20080200 - - -cited by applicant - - - - -US -D564191 -S -Jensen -20080300 - - -cited by applicant - - - - -US -D566937 -S -St-Louis et al. -20080400 - - -cited by applicant - - - - -US -D569085 -S -Belley et al. -20080500 - - -cited by applicant - - - - -US -D571087 -S -Dillenbeck et al. -20080600 - - -cited by applicant - - - - -US -D571986 -S -Horton -20080700 - - -cited by applicant - - - - -US -D571988 -S -Dillenbeck -20080700 - - -cited by applicant - - - - -US -D572885 -S -Jensen -20080700 - - -cited by applicant - - - - -US -D578283 -S -Duffy -20081000 - - -cited by examiner -USD 2955 - - - - -US -D580140 -S -Duffy -20081100 - - -cited by examiner -USD 2954 - - - - -US -D595484 -S -Purdom et al. -20090700 - - -cited by examiner -USD 2907 - - - - -US -D611236 -S -Dombrow -20100300 - - -cited by examiner -USD 2954 - - - - -US -D640044 -S -Badegruber -20110600 - - -cited by examiner -USD 2951 - - - - -US -D661882 -S -Raysse -20120600 - - -cited by examiner -USD 2954 - - - - -US -D662698 -S -Pulli et al. -20120700 - - -cited by applicant - - - - -US -D663108 -S -Pulli -20120700 - - -cited by applicant - - - - -US -D677869 -S -Labarbera et al. -20130300 - - -cited by applicant - - - - -US -D683528 -S -Sungadi -20130600 - - -cited by examiner -USD 2957 - - - - -US -D686401 -S -Portzline -20130700 - - -cited by examiner -USD 2957 - - - - -US -D686402 -S -Portzline -20130700 - - -cited by examiner -USD 2957 - - - - -US -D686404 -S -McCourt -20130700 - - -cited by examiner -USD 2958 - - - - -US -D702428 -S -Hlavacs -20140400 - - -cited by examiner -USD 2958 - - - - -US -D707933 -S -McCourt -20140700 - - -cited by examiner -USD 2957 - - - - -US -2008/0250666 -A1 -Votolato -20081000 - - -cited by examiner -US 36 71 R - - - - -US -2014/0123522 -A1 -Rustam et al. -20140500 - - -cited by examiner -US 36127 - - - - -US -2014/0325871 -A1 -Price et al. -20141100 - - -cited by examiner -US 36 28 - - - - -US -2014/0325876 -A1 -Dodge et al. -20141100 - - -cited by examiner -US 36103 - - - - -US -2014/0331517 -A1 -Seo -20141100 - - -cited by examiner -US 36 28 - - - - -KR -30-0676702 -20130100 - - -cited by applicant - - -1 -1 - - -US -D 2902 - - -US -D 2906 - - -US -D 2908 - - -US -D 2916 - - -US -D 2918 - - -US -D 2925 - - -US -D 2946-962 -unstructured - - -US -D 2977 - - -US - 36 3 B - - -US - 36 22 R - - -US - 36 245 - - -US - 36 25 R - - -US - 36 28 - - -US - 36 32 R - - -US - 36 34 R - - -US - 36 59 C - - -US - 36 67 A - - -US - 36103 - - - -5 -6 - - - - - -Wolverine World Wide, Inc. -
-Rockford -MI -US -
-
- -US - -
-
- - - -Dodge -Wilson S. -
-Grand Rapids -MI -US -
-
-
- - -Bohnsack -Shaun M. -
-Grand Rapids -MI -US -
-
-
- - -Matis -Clark A. -
-Durango -CO -US -
-
-
- - -Loveder -Christopher J. -
-Rockford -MI -US -
-
-
-
- - - -Warner Norcross & Judd LLP -
-unknown -
-
-
-
-
- - - -Wolverine World Wide, Inc. -02 -
-Rockford -MI -US -
-
-
-
- - -Nelson -T. Chase -2914 - - -
- -
-embedded image -
-
-embedded image -
-
-embedded image -
-
-embedded image -
-
-embedded image -
-
-embedded image -
-
- - - -

FIG. 1 is a perspective view of the footwear sole embodying the new design;

-

FIG. 2 is a bottom plan view thereof;

-

FIG. 3 is a right side elevational view thereof;

-

FIG. 4 is a left side elevational view thereof;

-

FIG. 5 is a front elevational view thereof; and,

-

FIG. 6 is a rear elevational view thereof.

-

FIGS. 1-6 show features of the footwear in phantom lines. These features are shown for environmental purposes, and do not form any part of the claimed design. Furthermore, the phantom lines around the perimeter, and immediately adjacent to the solid-line portion of the design, form the boundary of the design, with the phantom lines forming no part of the claimed design.

-
- -
-CLAIM - - -The ornamental design for footwear sole, as shown and described. - - -
- - - - - - -US -D0724296 -S1 -20150317 - - - - -US -29417673 -20120406 - - -29 - -14 - - -10 -0204 - - -US -D 2957 - D2951 - D2954 - D2960 - -Shoe outsole - - - - -US -D385987 -S -Bramani -19971100 - - -cited by examiner -USD 2959 - - - - -US -D423201 -S -Wilson -20000400 - - -cited by examiner -USD 2957 - - - - -US -D447854 -S -Rogers -20010900 - - -cited by examiner -USD 2957 - - - - -US -D450914 -S -Wilson -20011100 - - -cited by examiner -USD 2959 - - - - -US -D461946 -S -Burt -20020800 - - -cited by examiner -USD 2951 - - - - -US -D462157 -S -Burt -20020900 - - -cited by examiner -USD 2953 - - - - -US -D468083 -S -Morais -20030100 - - -cited by examiner -USD 2960 - - - - -US -D471697 -S -Laberge -20030300 - - -cited by examiner -USD 2960 - - - - -US -D485423 -S -Truelsen -20040100 - - -cited by examiner -USD 2953 - - - - -US -D488294 -S -Lancon -20040400 - - -cited by examiner -USD 2957 - - - - -US -D490596 -S -Belley et al. -20040600 - - -cited by examiner -USD 2957 - - - - -US -D508160 -S -Sonnergren -20050800 - - -cited by examiner -USD 2953 - - - - -US -D509345 -S -Munns -20050900 - - -cited by examiner -USD 2957 - - - - -US -D515291 -S -Sonnergren -20060200 - - -cited by examiner -USD 2954 - - - - -US -D530891 -S -Matis et al. -20061000 - - -cited by examiner -USD 2953 - - - - -US -D550436 -S -Matis et al. -20070900 - - -cited by examiner -USD 2953 - - - - -US -D552335 -S -Matis et al. -20071000 - - -cited by examiner -USD 2957 - - - - -US -D556985 -S -Schoenborn et al. -20071200 - - -cited by examiner -USD 2953 - - - - -US -D564192 -S -Covatch -20080300 - - -cited by examiner -USD 2959 - - - - -US -D564740 -S -Matis et al. -20080300 - - -cited by examiner -USD 2957 - - - - -US -D564741 -S -Covatch -20080300 - - -cited by examiner -USD 2957 - - - - -US -D566935 -S -Matis et al. -20080400 - - -cited by examiner -USD 2956 - - - - -US -D566938 -S -Matis et al. -20080400 - - -cited by examiner -USD 2957 - - - - -US -D566939 -S -Schoenborn et al. -20080400 - - -cited by examiner -USD 2957 - - - - -US -D566940 -S -Schoenborn et al. -20080400 - - -cited by examiner -USD 2957 - - - - -US -D567492 -S -Belley et al. -20080400 - - -cited by examiner -USD 2957 - - - - -US -D569592 -S -Banik et al. -20080500 - - -cited by examiner -USD 2956 - - - - -US -D604488 -S -Amphyon -20091100 - - -cited by examiner -USD 2953 - - - - -US -D655902 -S -Debiase -20120300 - - -cited by examiner -USD 2957 - - - - -US -D656304 -S -Debiase -20120300 - - -cited by examiner -USD 2960 - - - - -US -D659970 -S -Liao -20120500 - - -cited by examiner -USD 2962 - - - - -US -D661476 -S -Loverin -20120600 - - -cited by examiner -USD 2946 - - - - -US -D662695 -S -McVicker et al. -20120700 - - -cited by examiner -USD 2902 - - - - -US -D670491 -S -Ko et al. -20121100 - - -cited by examiner -USD 2962 - - - - -US -D671718 -S -McVicker et al. -20121200 - - -cited by examiner -USD 2908 - - - - -US -D677453 -S -Sakai -20130300 - - -cited by examiner -USD 2959 - - - - -US -D680723 -S -Joseph -20130400 - - -cited by examiner -USD 2957 - - - - -US -D689275 -S -Mahoney -20130900 - - -cited by examiner -USD 2959 - - - - -US -D693101 -S -Dombrow -20131100 - - -cited by examiner -USD 2953 - - - - -US -D698134 -S -Abshire et al. -20140100 - - -cited by examiner -USD 2951 - - - - -US -D698136 -S -Law et al. -20140100 - - -cited by examiner -USD 2961 - - - - -US -D702032 -S -Nakano -20140400 - - -cited by examiner -USD 2959 - - - - -US -2005/0138841 -A1 -Wu -20050600 - - -cited by examiner -US 36 25 R - - -1 -1 - - -US -D 2902 - - -US -D 2906 - - -US -D 2908 - - -US -D 2916 - - -US -D 2918 - - -US -D 2925 - - -US -D 2946-962 -unstructured - - -US -D 2977 - - -US - 36 3 B - - -US - 36 22 R - - -US - 36 245 - - -US - 36 25 R - - -US - 36 28 - - -US - 36 32 R - - -US - 36 34 R - - -US - 36 59 C - - -US - 36 67 A - - -US - 36103 - - - -4 -6 - - - - - -Law -Nicholas Joseph -
-New York -NY -US -
-
- -US - -
- - -Delaleu -Jerry -
-Brooklyn -NY -US -
-
- -US - -
-
- - - -Law -Nicholas Joseph -
-New York -NY -US -
-
-
- - -Delaleu -Jerry -
-Brooklyn -NY -US -
-
-
-
- - - -McAndrews Held & Malloy, Ltd. -
-unknown -
-
-
-
-
- - - -Sears Brands, L.L.C. -02 -
-Hoffman Estates -IL -US -
-
-
-
- - -Nelson -T. Chase -2914 - - -
- -
-embedded image -
-
-embedded image -
-
-embedded image -
-
-embedded image -
-
-embedded image -
-
- - - -

FIG. 1 is a bottom front perspective view of a shoe outsole showing the new design;

-

FIG. 2 is a bottom plan view thereof;

-

FIG. 3 is a right side elevational view thereof;

-

FIG. 4 is a left side elevational view thereof;

-

FIG. 5 is a front side view thereof; and,

-

FIG. 6 is a rear side view thereof.

-

Any elements shown in dotted lines are provided for purposes of illustrating portions of the shoe outsole that form no part of the claimed design.

-
- -
-CLAIM - - -What is claimed is the ornamental design for a shoe outsole, as shown and described. - - -
- - - - - - -US -D0724297 -S1 -20150317 - - - - -US -29441371 -20130104 - - -29 - -14 - - -10 -0204 - - -US -D 2957 - D2951 - D2953 - D2960 - -Shoe outsole - - - - -US -D286342 -S -Stubblefield -19861000 - - -cited by examiner -USD 2957 - - - - -US -D287661 -S -Tonkel -19870100 - - -cited by examiner -USD 2957 - - - - -US -D288027 -S -Tonkel -19870200 - - -cited by examiner -USD 2957 - - - - -US -D543340 -S -Favreau et al. -20070500 - - -cited by examiner -USD 2960 - - - - -US -D553334 -S -Belley et al. -20071000 - - -cited by examiner -USD 2955 - - - - -US -D553835 -S -McClaskie -20071000 - - -cited by examiner -USD 2959 - - - - -US -D561440 -S -Andersen et al. -20080200 - - -cited by examiner -USD 2957 - - - - -US -D571087 -S -Dillenbeck et al. -20080600 - - -cited by examiner -USD 2953 - - - - -US -D574130 -S -Le -20080800 - - -cited by examiner -USD 2956 - - - - -US -D586991 -S -Fuerst -20090200 - - -cited by examiner -USD 2957 - - - - -US -D594195 -S -Nakano -20090600 - - -cited by examiner -USD 2957 - - - - -US -D597295 -S -Duffy -20090800 - - -cited by examiner -USD 2977 - - - - -US -D601334 -S -Werman -20091000 - - -cited by examiner -USD 2959 - - - - -US -D602683 -S -Roundhouse -20091000 - - -cited by examiner -USD 2957 - - - - -US -D604488 -S -Amphyon -20091100 - - -cited by examiner -USD 2953 - - - - -US -D607192 -S -McClaskie -20100100 - - -cited by examiner -USD 2959 - - - - -US -7762008 -B1 -Clark et al. -20100700 - - -cited by examiner -US 36 3 B - - - - -US -D632879 -S -Merkazy et al. -20110200 - - -cited by examiner -USD 2953 - - - - -US -D634923 -S -Lacey -20110300 - - -cited by examiner -USD 2960 - - - - -US -8082684 -B2 -Munns -20111200 - - -cited by examiner -US 36 25 R - - - - -US -D657542 -S -Duan -20120400 - - -cited by examiner -USD 2960 - - - - -US -D657941 -S -Bramani et al. -20120400 - - -cited by examiner -USD 2902 - - - - -US -D662292 -S -Meynard -20120600 - - -cited by examiner -USD 2923 - - - - -US -D662701 -S -Raysse -20120700 - - -cited by examiner -USD 2957 - - - - -US -D697296 -S -Loyley -20140100 - - -cited by examiner -USD 2953 - - - - -US -2008/0229617 -A1 -Johnson et al. -20080900 - - -cited by examiner -US 36102 - - - - -US -2009/0083994 -A1 -Luedecke et al. -20090400 - - -cited by examiner -US 36 81 - - - - -US -2010/0180474 -A1 -Clark et al. -20100700 - - -cited by examiner -US 36 3 B - - -1 -1 - - -US -D 2902 - - -US -D 2906 - - -US -D 2908 - - -US -D 2916 - - -US -D 2918 - - -US -D 2925 - - -US -D 2946-962 -unstructured - - -US -D 2977 - - -US - 36 3 B - - -US - 36 22 R - - -US - 36 245 - - -US - 36 25 R - - -US - 36 28 - - -US - 36 32 R - - -US - 36 34 R - - -US - 36 59 C - - -US - 36 67 A - - -US - 36103 - - - -3 -6 - - - - - -Honeywell International, Inc. -
-Morristown -NJ -US -
-
- -US - -
-
- - - -Oliver -Andrew Wilson -
-Victoria -AU -
-
-
-
- - - -Thompson Patent Law -
-unknown -
-
-
- - -Thompson -Craige -
-unknown -
-
-
-
-
- - - -Honeywell International Inc. -02 -
-Morristown -NJ -US -
-
-
-
- - -Nelson -T. Chase -2914 - - -
- -
-embedded image -
-
-embedded image -
-
-embedded image -
-
-embedded image -
-
- - - -

FIG. 1 is an front perspective view of a shoe outsole showing the new design;

-

FIG. 2 is a plan view of the shoe outsole of FIG. 1;

-

FIG. 3 is a front view of the shoe outsole of FIG. 1; and,

-

FIG. 4 is a rear view of the shoe outsole of FIG. 1.

-

FIG. 5 is a left side view of the shoe outsole of FIG. 1; and,

-

FIG. 6 is a right side view of the shoe outsole of FIG. 1.

-

The broken lines shown in the drawings illustrate environmental structure associated with the shoe outsole in a condition of use. The broken lines and structures they depict form no part of the claimed design.

-
- -
-CLAIM - - -The ornamental design for a shoe outsole, as shown and described. - - -
\ No newline at end of file diff --git a/README.md b/patent-slurper/README.md similarity index 100% rename from README.md rename to patent-slurper/README.md diff --git a/patent-slurper/patent-slurper.pl b/patent-slurper/patent-slurper.pl new file mode 100644 index 0000000..8b26afd --- /dev/null +++ b/patent-slurper/patent-slurper.pl @@ -0,0 +1,183 @@ +#!/usr/bin/env perl + +use 5.010; +#use strict; +use warnings; +use XML::Simple; +use XML::Twig; +use Time::Piece; + +=pod + +=head1 NAME + +PATENT_SLURPER - A program to process Google/USPTO data dumps + +=head1 VERSION + +0.8 + +=head1 DESCRIPTION + +This program takes L +and produces SQL commands to generate a database from them with a +number of selected fields. + +=head1 AUTHOR + +L + +=head1 LICENSE + +=cut + +# Trims the file extension from the filename argument +my $filename = $ARGV[0]; +chomp $filename; + +my $patentTwig = new XML::Twig(TwigRoots => { + 'SDOBI/B100/B140/DATE/PDAT' => 1, + 'SDOBI/B100/B110/DNUM/PDAT' => 2, + 'SDOBI/B200/B220/DATE/PDAT' => 3, + 'SDOBI/B200/B210/DNUM/PDAT' => 4 + }, + TwigHandlers => { + 'SDOBI/B100/B140/DATE/PDAT' => sub { $_->set_tag( 'appdate') }, + 'SDOBI/B100/B110/DNUM/PDAT' => sub { $_->set_tag( 'appnum') }, + 'SDOBI/B200/B220/DATE/PDAT' => sub { $_->set_tag( 'pubdate') }, + 'SDOBI/B200/B210/DNUM/PDAT' => sub { $_->set_tag( 'pubnum') } + }, + pretty_print => 'indented'); +my $citationTwig = new XML::Twig(TwigRoots => { + 'SDOBI/B200/B210/DNUM/PDAT' => 1, + 'SDOBI/B500/B560/B561/PCIT/DOC/DNUM/PDAT' => 2 + }, + TwigHandlers => { + 'SDOBI/B200/B210/DNUM/PDAT' => sub { $_->set_tag( 'pubnum') }, + 'SDOBI/B500/B560/B561/PCIT/DOC/DNUM/PDAT' => sub { $_->set_tag('citing') } + }, + pretty_print => 'indented'); + +my $numLines = countFile($filename); +print "Processing $numLines lines...\n"; +processFile($filename, $numLines); +print "File processing finished - press '1' to generate SQL statements, or '0' to quit.\n"; +while (1) { + given () { + when(1) { + generateSQL($filename); + print "SQL generation finished.\n"; + exit 0; + } when(0) { + exit 0; + } default { + print "Press '1' to generate SQL statements, or '0' to quit.\n"; + } + }; +} + +# Goes through the file serially to count the lines +sub countFile { + my $lineNum = 0; + open(INFILE, "data/".$_[0].".xml") or die "Can't open ".$_[0].": $!"; + foreach() { + ++$lineNum; + } + close(INFILE); + return $lineNum; +} + +# Processes the file line-by-line, removing duplicate and +# tags and extracting the fields listed above. It has to be +# done line-by-line (hence the use of XML::Twig rather than XML:Simple) +# rather than loading the entire .xml file into memory because the files +# are far too big to fit. +sub processFile { + my $buffer = "", my $firstItem = 1, my $currentLine = 1; + + open(INFILE, "data/".$_[0].".xml") or die "Can't open ".$_[0].": $!"; + unlink("details/".$_[0].".xml"); + unlink("citations/".$_[0].".xml"); + open(my $detailsFile, ">>details/".$_[0].".xml") or die "Can't output ".$_[0].": $!"; + open(my $citationsFile, ">>citations/".$_[0].".xml") or die "Can't output ".$_[0].": $!"; + + # Prints the root node to the files for XML::Simple in generateSQL() + #print $detailsFile "\n"; + #print $citationsFile "\n\n"; + + # For each line, build up a buffer (excluding the and + # tags). When the next item is reached + # (a.k.a. when the next tag after the initial one is reached), + # run the buffer through the details and citations twigs and print + # the results to the relevant files. Then clear the buffer for the next + # + foreach() { + print "Processing line ".($currentLine++)."/".$_[1]."...\n"; + + #if ($_ !~ /^\<\?xml/ && $firstItem == 0) { + #if ($_ !~ /^\<\!DOCTYPE/) { + #} + #} elsif ($firstItem == 1) { + # $firstItem = 0; + #} else { + if ($_ =~ /^\<\?xml/ && $firstItem == 0) { + #print "\n----\n".$buffer."\n----\n"; + $patentTwig->parse($buffer); + $patentTwig->print($detailsFile); + $citationTwig->parse($buffer); + $citationTwig->print($citationsFile); + + $buffer = ""; + } elsif ($_ !~ /^\<\!/ && $_ !~ /^\]\>/) { + if ($firstItem == 0) { + $string = $_; + $string =~ s/\&[a-zA-Z0-9]*;/zonk/g; + $buffer = $buffer.$string; + + } else { + + print $detailsFile "\n"; + print $citationsFile "\n\n"; + $firstItem = 0; + } + } + } + + print $detailsFile ""; + print $citationsFile ""; + + close($detailsFile); + close($citationsFile); + close(INFILE); +} + +# Generates an SQL dump of the database formed from analysing the .xml +# files. +sub generateSQL { + my $xml = new XML::Simple (KeyAttr=>[]); + + my $details = $xml->XMLin("details/".$_[0].".xml"); + + unlink("sql/".$_[0].".sql"); + open(my $sqlFile, ">>sql/".$_[0].".sql") or die "Can't output SQL ".$_[0].": $!"; + + print $sqlFile "CREATE TABLE IF NOT EXISTS `patent`\n(\n\t`pid` INT NOT NULL AUTO_INCREMENT,\n\t`pubNum` VARCHAR(32),\n\t`pubDate` DATETIME,\n\t`appNum` VARCHAR(32),\n\t`appDate` DATETIME,\n\tPRIMARY KEY(`pid`)\n);\n\nCREATE TABLE IF NOT EXISTS `patent_cite`\n(\n\t`citing_id` VARCHAR(32) NOT NULL,\n\t`cited_id` VARCHAR(32) NOT NULL,\n\tPRIMARY KEY (`citing_id`, `cited_id`)\n);\n\n"; + print $sqlFile "INSERT INTO `patent` (`pubNum`, `pubDate`, `appNum`, `appDate`) VALUES"; + foreach my $e (@{$details->{'PATDOC'}}) { + print $sqlFile "\n\t('".$e->{'pubnum'}."', '".$e->{'pubdate'}."', '".$e->{'appnum'}."', '".$e->{'appdate'}."'),"; + } + print $sqlFile "\n\t('0', '0', '0', '0');\n\n-- This line and the above (0,0,0,0) tuple are needed due to the nature\n-- of the loop that builds the INSERT query, and the resultant SQL file\n-- being too long to edit from the end easily.\nDELETE FROM `patent` WHERE `pid` = '0';"; + + my $citations = $xml->XMLin("citations/".$_[0].".xml"); + + print $sqlFile "\n\nINSERT INTO `patent_cite` (`citing_id`, `cited_id`) VALUES"; + foreach my $f (@{$citations->{'PATDOC'}}) { + my $pubNum = $f->{'pubnum'}; + foreach (@{$f->{'citing'}}) { + print $sqlFile "\n\t('".$pubNum."', '".$_."'),"; + } + } + print $sqlFile "\n\t('0', '0', '0', '0');\n\n-- This line and the above (0,0,0,0) tuple are needed due to the nature\n-- of the loop that builds the INSERT query, and the resultant SQL file\n-- being too long to edit from the end easily.\nDELETE FROM `patent_cite` WHERE `citing_id` = '0';"; + + close($sqlFile); +} diff --git a/patent_slurper.pl b/patent_slurper.pl deleted file mode 100644 index 1281825..0000000 --- a/patent_slurper.pl +++ /dev/null @@ -1,104 +0,0 @@ -#!/usr/bin/perl - -use 5.010; -use strict; -use warnings; -use XML::Simple; -use XML::Twig; -use Time::Piece; - -my $filename = $ARGV[0]; - -# Reprints only the following values from each entry in the .xml file: -# - application date -# - application number -# - publication date -# - publication number -my $twig = new XML::Twig(TwigRoots => {'application-reference/document-id/date' => 1, - 'application-reference/document-id/doc-number' => 2, - 'publication-reference/document-id/date' => 3, - 'publication-reference/document-id/doc-number' => 4}, - TwigHandlers => {'application-reference/document-id/date' => sub { $_->set_tag( 'application-date') }, - 'application-reference/document-id/doc-number' => sub { $_->set_tag( 'application-number') }, - 'publication-reference/document-id/date' => sub { $_->set_tag( 'publication-date') }, - 'publication-reference/document-id/doc-number' => sub { $_->set_tag( 'publication-number') }}, - pretty_print => 'indented'); - - -my $numLines = countFile($filename); -print "Processing $numLines lines...\n"; -processFile($filename, $numLines); -print "File processing finished - press '1' to generate SQL statements, or '0' to quit.\n"; -while (1) { - given () { - when(1) { - generateSQL($filename); - print "SQL generation finished.\n"; - exit 0; - } - when(0) { exit 0; } - default { print "Press '1' to generate SQL statements, or '0' to quit.\n"; } - }; -} - -sub countFile { - my $lineNum = 0; - open(INFILE, $_[0].".xml") or die "Can't open ".$_[0].": $!"; - foreach() { - ++$lineNum; - } - close(INFILE); - return $lineNum; -} - -sub processFile { - my $buffer = ""; - my $firstItem = 1; - my $currentLine = 1; - open(INFILE, $_[0].".xml") or die "Can't open ".$_[0].": $!"; - open(my $finalFile, ">".$_[0]."FINAL.xml") or die "Can't clear FINAL ".$_[0].": $!"; - print $finalFile ""; - close($finalFile); - open(my $finalFile, ">>".$_[0]."FINAL.xml") or die "Can't output FINAL ".$_[0].": $!"; - print$finalFile "\n\n"; - foreach() { - print "Processing line ".$currentLine."/".$_[1]."...\n"; - ++$currentLine; - my($line) = $_; - if ($line !~ /^\<\?xml/ && $firstItem == 0) { - if ($line !~ /^\<\!DOCTYPE/) { - $buffer = $buffer.$line; - } - } else { - if ($firstItem == 1) { - $firstItem = 0; - } else { - $twig->parse($buffer); - $twig->print($finalFile); - - $buffer = ""; - } - } - } - print $finalFile ""; - close($finalFile); - close(INFILE); -} - -sub generateSQL { - my $xml = new XML::Simple (KeyAttr=>[]); - - # read XML file - my $data = $xml->XMLin($_[0]."FINAL.xml"); - - open(my $sqlFile, ">".$_[0]."SQL.xml") or die "Can't output SQL ".$_[0].": $!"; - print $sqlFile ""; - close($sqlFile); - - open(my $sqlFile, ">>".$_[0]."SQL.xml") or die "Can't output SQL ".$_[0].": $!"; - print $sqlFile "CREATE TABLE IF NOT EXISTS `patents`\n(\n\t`pid` INT NOT NULL AUTO_INCREMENT,\n\tPRIMARY KEY(`pid`),\n\t`pubNum` VARCHAR(32),\n\t`pubDate` DATETIME,\n\t`appNum` VARCHAR(32),\n\t`appDate` DATETIME\n);\n\n"; - foreach my $e (@{$data->{'us-patent-grant'}}) { - print $sqlFile "INSERT INTO `patents`(`pubNum`, `pubDate`, `appNum`, `appDate`) VALUES ('".$e->{'publication-number'}."', '".$e->{'publication-date'}."', '".$e->{'application-number'}."', '".$e->{'application-date'}."');\n"; - } - close($sqlFile); -} diff --git a/patentlast.xml b/patentlast.xml deleted file mode 100644 index 7df5957..0000000 --- a/patentlast.xml +++ /dev/null @@ -1,723 +0,0 @@ - - - - - - -US -08984661 -B2 -20150317 - - - - -US -14033070 -20130920 - - -14 - - -20100101 -A -
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-01 -Q -60 -22 -L -I -20150317 -US -B -H -
- -20110101 -A -
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-82 -Y -20 -00 -L -N -20150317 -US -B -H -
- -20110101 -A -
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-82 -Y -35 -00 -L -N -20150317 -US -B -H -
-
- - - -20130101 -
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-01 -Q -60 -22 -F -I -20150317 -US -B -H -C -
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- - -20130101 -
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-82 -Y -20 -00 -L -A -20150317 -US -B -H -C -
- -20130101 -
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-82 -Y -35 -00 -L -A -20150317 -US -B -H -C -
-
-
- -US -850 60 -850 52 -850 61 - -Probes for multidimensional nanospectroscopic imaging and methods of fabrication thereof - - - - -US -2007/0151989 -A1 -Espinosa et al. -20070700 - - -cited by examiner -US222462 - - - - -US -2008/0098805 -A1 -Jin et al. -20080500 - - -cited by examiner -US 73105 - - - - -US -2008/0272299 -A1 -Jin et al. -20081100 - - -cited by examiner -US250310 - - - - -US -2009/0133171 -A1 -Jin -20090500 - - -cited by examiner -US850 60 - - - -Monika Fleischer, “Near-field scanning optical microscopy nanoprobes,” Nanotechnology Reviews. vol. 1, Issue 4, pp. 313-338. - -cited by applicant - - - -Wei Bao et al., “Mapping Local Charge Recombination Heterogeneity by Multidimensional Nanospectroscopic Imaging,” Science Dec. 7, 2012: 338 (6112), 1317-1321. - -cited by applicant - - - -J. Stadler, T. Schmid, R. Zenobi, “Developments in and practical guidelines for tip-enhanced Raman spectroscopy” Nanoscale 4, 1856 (2012). - -cited by applicant - - - -Y. Wang, W. Srituravanich, C. Sun, X. Zhang, “Plasmonic Nearfield Scanning Probe with High Transmission,” Nano Lett. 8, 3041 (2008). - -cited by applicant - - - -J. N. Farahani, D. W. Pohl, H. J. Eisler, B. Hecht, “Single Quantum Dot Coupled to a Scanning Optical Antenna: A Tunable Superemitter,” Phys. Rev. Lett. 95, 017402 (2005). - -cited by applicant - - - -A. Weber-Bargioni et al., “Hyperspectral Nanoscale Imaging on Dielectric Substrates with Coaxial Optical Antenna Scan Probes” Nano Lett. 11, 1201 (2011). - -cited by applicant - - - -M. Staffaroni, J. Conway, S. Vedantam, J. Tang, E. Yablonovitch, “Circuit analysis in metal-optics” Photonics Nanostructures Fundam. Appl. 10, 166 (2012). - -cited by applicant - - - -M. I. Stockman, “Nanofocusing of Optical Energy in Tapered Plasmonic Waveguides” Phys. Rev. Lett. 93, 137404 (2004). - -cited by applicant - - - -P. Ginzburg, D. Arbel, M. Orenstein, “Gap plasmon polariton structure for very efficient microscale-to-nanoscale interfacing” Opt. Lett. 31, 3288 (2006). - -cited by applicant - - - -S. Vedantam et al., “A Plasmonic Dimple Lens for Nanoscale Focusing of Light” Nano Lett. 9, 3447 (2009). - -cited by applicant - - -20 -1 - - -US -850 52 - - -US -850 56 - - -US -850 57 - - -US -850 58 - - -US -850 59 - - -US -850 60 - - -US -850 61 - -G01Q 70/02 -G01Q 70/08 -G01Q 70/10 -G01Q 70/14 -G01Q 70/16 - - -8 -9 - - - - -US -61704270 -20120921 - - - - -US -20140090118 -A1 -20140327 - - - - - - - -Weber-Bargioni -Alexander -
-Albany -CA -US -
-
- -US - -
- - -Cabrini -Stefano -
-Albany -CA -US -
-
- -US - -
- - -Bao -Wei -
-Albany -CA -US -
-
- -US - -
- - -Melli -Mauro -
-Albany -CA -US -
-
- -US - -
- - -Yablonovitch -Eli -
-Oakland -CA -US -
-
- -US - -
- - -Schuck -Peter J. -
-Oakland -CA -US -
-
- -US - -
-
- - - -Weber-Bargioni -Alexander -
-Albany -CA -US -
-
-
- - -Cabrini -Stefano -
-Albany -CA -US -
-
-
- - -Bao -Wei -
-Albany -CA -US -
-
-
- - -Melli -Mauro -
-Albany -CA -US -
-
-
- - -Yablonovitch -Eli -
-Oakland -CA -US -
-
-
- - -Schuck -Peter J. -
-Oakland -CA -US -
-
-
-
- - - -Lawrence Berkeley National Laboratory -
-unknown -
-
-
-
-
- - - -The Regents of the University of California -02 -
-Oakland -CA -US -
-
-
-
- - -Ippolito -Nicole -2881 - - -
- -

This disclosure provides systems, methods, and apparatus related to probes for multidimensional nanospectroscopic imaging. In one aspect, a method includes providing a transparent tip comprising a dielectric material. A four-sided pyramidal-shaped structure is formed at an apex of the transparent tip using a focused ion beam. Metal layers are deposited over two opposing sides of the four-sided pyramidal-shaped structure.

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- - -RELATED APPLICATIONS -

This application claims priority to U.S. Provisional Patent Application No. 61/704,270, filed Sep. 21, 2012. This application is related to U.S. patent application Ser. No. 13/083,228, filed Apr. 8, 2011, which is herein incorporated by reference.

- - -STATEMENT OF GOVERNMENT SUPPORT -

This invention was made with government support under Contract No. DE-AC02-05CH11231 awarded by the U.S. Department of Energy. The government has certain rights in this invention.

- - -TECHNICAL FIELD -

This disclosure relates generally to optical spectroscopy and more particularly to devices operable to generate a focused optical beam spot and methods of fabrication thereof.

-BACKGROUND -

An ongoing challenge to understanding matter at the nanoscale is the difficulty in carrying out local optical spectroscopy. On a fundamental level, this should be possible by squeezing light beyond the diffraction limit. Optical-antenna-based geometries have been designed to address this nanospectroscopy imaging problem by transforming light from the far-field to the near-field, but unfortunately with serious limitations on sensitivity, bandwidth, resolution, and/or sample types.

-SUMMARY -

A strategy that overcomes the limitations of optical-antenna-based geometries (e.g., sensitivity, bandwidth, resolution, and/or sample types), based on a unique geometry capable of efficiently coupling far-field light to the near-field and vice-versa without background illumination, and over a wide range of wavelengths, is described herein. In some embodiments, the geometry includes a campanile probe, a three-dimensional tapered structure terminating in a nanometer sized gap, with a shape resembling that of a “campanile” bell tower.

-

One innovative aspect of the subject matter described in this disclosure can be implemented a method including: (a) providing a transparent tip comprising a dielectric material; (b) forming a four-sided pyramidal-shaped structure at an apex of the transparent tip using a focused ion beam; and (c) depositing metal layers over two opposing sides of the four-sided pyramidal-shaped structure.

-

In some embodiments, the method further includes after operation (c), forming a gap between the metal layers at an apex of the four-sided pyramidal-shaped structure. In some embodiments, the method further includes, before operation (c), depositing adhesion layers on the two opposing sides of the four-sided pyramidal-shaped structure, with the metal layers being deposited on the adhesion layers. In some embodiments, depositing the adhesion layers is performed with a shadow evaporation process, with the adhesion layers comprising a metal.

-

In some embodiments, the method further comprises after operation (c), depositing a dielectric layer over the four-sided pyramidal-shaped structure, including the metal layers. In some embodiments, the dielectric layer is about 2 nanometers to 5 nanometers thick. In some embodiments, the dielectric layer is selected from a group consisting of silicon oxide, aluminum oxide, hafnium oxide, and silicon nitride.

-

In some embodiments, operation (c) is performed with a shadow evaporation process. In some embodiments, the metal layers are selected from a group consisting of gold, silver, copper, and aluminum. In some embodiments, the metal layers are about 25 nanometers to 75 nanometers thick.

-

In some embodiments, the gap is about 1 nanometer to 100 nanometers wide between the metals layers deposited on the two opposing sides of the four-sided pyramidal-shaped structure. In some embodiments, the gap is about 25 nanometers to 75 nanometers deep in the dielectric material. In some embodiments, the dielectric material is selected from a group consisting of an optically transparent polymer, diamond, silicon oxide, silicon nitride, aluminum oxide, indium tin oxide, and hafnium oxide.

-

Another innovative aspect of the subject matter described in this disclosure can be implemented a method including: (a) providing an transparent tip comprising a dielectric material; (b) forming a four-sided pyramidal-shaped structure at an apex of the transparent tip using a focused ion beam; and (c) depositing doped semiconductor layers over two opposing sides of the four-sided pyramidal-shaped structure.

-

In some embodiments, the method further includes after operation (c), forming a gap between the doped semiconductor layers at an apex of the four-sided pyramidal-shaped structure. In some embodiments, the doped semiconductor layers are selected from a group consisting of doped-titanium oxide, doped-zirconium oxide, doped-zinc oxide, and tin-doped indium oxide (ITO).

-

Another innovative aspect of the subject matter described in this disclosure can be implemented a device including a transparent tip, metal layers, and a dielectric layer. The transparent tip comprises a dielectric material, with an apex of the transparent tip including a four-sided pyramidal-shaped structure. The metal layers are disposed over two opposing sides of the four-sided pyramidal-shaped structure, with an apex of the four-sided pyramidal-shaped structure including a gap between the metal layers. The dielectric layer is disposed on the four-sided pyramidal-shaped structure, including the metal layers.

-

In some embodiments, the device further includes adhesion layers disposed on the two opposing sides of the four-sided pyramidal-shaped structure, with the metal layers being disposed on the adhesion layers. In some embodiments, the adhesion layers are selected from a group consisting of titanium and chromium.

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In some embodiments, the dielectric layer is selected from a group consisting of silicon oxide, aluminum oxide, hafnium oxide, and silicon nitride. In some embodiments, the dielectric layer is about 2 nanometers to 5 nanometers thick.

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Details of one or more embodiments of the subject matter described in this specification are set forth in the accompanying drawings and the description below. Other features, aspects, and advantages will become apparent from the description, the drawings, and the claims. Note that the relative dimensions of the following figures may not be drawn to scale.

- - - -BRIEF DESCRIPTION OF THE DRAWINGS -

FIG. 1 shows an example of an isometric illustration of a campanile probe.

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FIGS. 2A, 2B, and 3 show examples of cross-sectional schematic illustrations of the apex of a four-sided pyramidal-shaped structure of a campanile probe.

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FIGS. 4 and 5 show examples of scanning electron microscope (SEM) photographs of a campanile probe.

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FIG. 6A shows an example of a top-down schematic illustration of an end or apex of a MIM probe.

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FIG. 6B shows an example of a cross-sectional schematic illustration of a MIM probe including a tapered cylindrical coaxial structure.

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FIG. 7 shows an example of a flow diagram illustrating a manufacturing process for a campanile probe.

-
- - -DETAILED DESCRIPTION -

Reference will now be made in detail to some specific examples of the invention including the best modes contemplated by the inventors for carrying out the invention. Examples of these specific embodiments are illustrated in the accompanying drawings. While the invention is described in conjunction with these specific embodiments, it will be understood that it is not intended to limit the invention to the described embodiments. On the contrary, it is intended to cover alternatives, modifications, and equivalents as may be included within the spirit and scope of the invention as defined by the appended claims.

-

In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. Particular example embodiments of the present invention may be implemented without some or all of these specific details. In other instances, well known process operations have not been described in detail in order not to unnecessarily obscure the present invention.

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Various techniques and mechanisms of the present invention will sometimes be described in singular form for clarity. However, it should be noted that some embodiments include multiple iterations of a technique or multiple instantiations of a mechanism unless noted otherwise.

-INTRODUCTION -

Various near-field probe geometries have been engineered with extraordinary optical transmission or with coupled optical antenna structures directly on the scan-probe apex, greatly improving coupling efficiencies. However, these generally rely on resonant structures with limited spectral bandwidth and have often used excitation modalities that are not background-free. Of note are recent approaches combining elements of apertureless near-field scanning microscopy (a-NSOM) tips with efficient photon-to-plasmon coupling structures that can be illuminated far from the sample. When designed correctly, these types of probes can be broadband since they exploit adiabatic plasmonic compression.

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There is, however, one drawback to these probes: maximum enhancement is only achieved in the tip-substrate gap mode. The tip-substrate gap mode can yield large near-field signals, but requires both a metallic substrate and a very small tip-substrate gap. Therefore, only very thin samples (e.g., molecular monolayers) can be studied.

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Embodiments described herein can overcome all these problems, offering a different concept that unites broadband field enhancement and confinement with efficient bi-directional coupling between far-field and near-field electromagnetic energy, thereby enabling the translation of the wide spectrum of optical measurement modalities to the nanometer scale.

-

Device and Methods

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Embodiments of a campanile probe disclosed herein are based on a three-dimensional tapered metal-insulator-metal (MIM) structure ending in a nanogap. Simulations have shown that this geometry can provide efficient coupling between far- and near-fields since the fundamental mode in an MIM structure is supported without any cut-off frequency, no matter how thin the insulating layer. In the optical regime, where plasmonic effects become important at small length scales, it has been shown that efficient delivery of far-field light to an ultra-small region is possible in two dimensions using a tapered planar MIM structure (>70% conversion efficiency), and in three dimensions with a dimple lens structure. Equally important is the fact that the bi-directional coupling of the campanile probe is efficient over a large bandwidth, taking advantage of an adiabatically-tapered geometry utilized at longer wavelengths (e.g., the microwave and terahertz regimes) to provide a simple broadband method for effectively overcoming the diffraction limit. The bandwidth may be limited by metal absorption at short wavelengths, and can be extended well into the infrared region (and beyond). Other metals can be used to access the blue or ultraviolet (UV) regions.

-

FIG. 1 shows an example of an isometric illustration of a campanile probe. A campanile probe 100 comprises a transparent tip comprising a dielectric material 105. An apex of the transparent tip includes a four-sided pyramidal-shaped structure. Metal layers 110 and 115 are disposed over two opposing sides of the four-sided pyramidal-shaped structure. An apex 120 of the four-sided pyramidal-shaped structure includes a gap between the metal layers 110 and 115.

-

In some embodiments, the dielectric material 105 of the transparent tip may comprise an optically transparent material; an optically transparent material is a material that allows light (e.g., visible light, infrared light, or ultraviolet light) to pass through the material without being scattered. In some embodiments, the dielectric material 105 of the transparent tip may comprise an optically transparent polymer, diamond, silicon oxide (SiO2, SiO, SiOx, where x is a non-integer number), silicon nitride (Si3N4), aluminum oxide (Al2O3), indium tin oxide (ITO, a solid solution of indium oxide (In2O3) and tin oxide (SnO2)), and hafnium oxide (HfO2).

-

In some embodiments, the metal layers 110 and 115 may comprise gold, silver, copper, or aluminum. In some embodiments, the metal layers may be about 25 nanometers (nm) to 75 nm thick, or about 50 nm thick. In some embodiments, the metal layer may be greater than about 75 nm thick. Such a campanile probe having metal layers may be used with visible light.

-

In some embodiments, the campanile probe 100 may include adhesion layers (now shown) disposed on the two opposing sides of the four-sided pyramidal-shaped structure. The metal layers 110 and 115 are disposed on the adhesion layers. The adhesion layers may aid in adhering the metal layers 110 and 115 to the dielectric material 105.

-

In some embodiments, the adhesion layers may comprise a metal. For example, in some embodiments, the adhesion layers may comprise titanium or chromium. In some embodiments, the adhesion layers may be about 1 nm to 5 nm thick, or about 2 nm thick.

-

In some embodiments, the campanile probe 100 may include a dielectric layer (not shown) disposed on the four-sided pyramidal-shaped structure, including the metal layers. In some embodiments, the dielectric layer comprises silicon oxide, aluminum oxide, hafnium oxide, or silicon nitride. In some embodiments, the dielectric layer may be about 2 nm to 5 nm thick.

-

In some embodiments, the dielectric layer may protect the metal layers 110 and 115 from oxidation and from mechanical damage when the campanile probe 100 is in use. Such a dielectric layer also may aid in keeping the metal layers 110 and 115 disposed on or over the four-sided pyramidal-shaped structure. For example, the metal layers of a campanile probe that does not include the dielectric layer may peel away from or flake off of the four-sided pyramidal-shaped structure when the campanile probe is in operation. Further, the dielectric layer may reduce or prevent atomic migration of the metal layers 110 and 115 (e.g., due to thermal effects), which may also aid in keeping the metal layers 110 and 115 disposed on or over the four-sided pyramidal-shaped structure. In some embodiments, the dielectric layer may prevent electrical contact between a sample being studied and the campanile probe.

-

In some embodiments, a substantially square or a rectangular base 125 of the dielectric material 105 comprising the four-sided pyramidal-shaped structure may have dimensions of about 50 nm to 20 microns by about 50 nm to 20 microns, about 50 nm to 5 microns by about 50 nm to 5 microns, or about 100 nm to 200 nm by about 100 nm to 200 nm. In some embodiments, at least one dimension of the substantially square or a rectangular base 125 (i.e., a length or a width) may have a dimension that is that is larger than the wavelength of the electromagnetic radiation to be used with the campanile probe 100.

-

In some embodiments, the substantially square or a rectangular base 125 may have a height of about 1 nm to 5 microns or about 1 nm to 1 micron. In some embodiments, the substantially square or a rectangular base 125 may have a specific height to aid in the fabrication process. In some embodiments, the four-sided pyramidal-shaped structure may have a square or a rectangular base, but the base may have no height or a height of zero.

-

In some embodiments, an angle 130 at which a side of the four-sided pyramidal-shaped structure slopes compared to a vertical axis of the campanile probe 100 may be about 15 degrees to 45 degrees, about 20 degrees to 40 degrees, or about 30 degrees.

-

FIGS. 2A, 2B, and 3 show examples of cross-sectional schematic illustrations of the apex of a four-sided pyramidal-shaped structure of a campanile probe. As shown in FIG. 2A, the apex 120 of the four-sided pyramidal-shaped structure includes a gap between the metal layers 110 and 115. In some embodiments, the gap may be about 1 nm to 100 nm wide, about 2 nm to 50 nm wide, or less about 10 nm wide, between the metal layers 110 and 115. In some embodiments, the gap may define a substantially flat surface of the dielectric material 105 of the transparent tip, and separate the metal layers 110 and 115 by about 1 nm to 100 nm or about 2 nm to 50 nm. In some embodiments, a length of the gap (i.e., into the paper of the cross sectional schematic illustration shown in FIG. 2A) may be about 1 nm to 15 nm, about 15 nm to 45 nm, or about 30 nm.

-

In some embodiments, the apex of the four-sided pyramidal-shaped structure may include a substantially flat surface comprising the dielectric material 105. In some embodiments, the edges of the metal layers 110 and 115 may be tapered, as shown by the dashed lines at that apex of the four-sided pyramidal-shaped structure shown in FIG. 2B.

-

In some embodiments, some or all of the dielectric material may be removed from the gap between the two metal layers. An example of such an apex of a four-sided pyramidal-shaped structure is shown in FIG. 3. The apex 300 of the four-sided pyramidal-shaped structure shown in FIG. 3 includes a gap between the metal layers 110 and 115. In some embodiments, the gap may be about 1 nm to 100 nm wide, about 2 nm to 50 nm wide, or less than about 10 nm wide, between the metal layers 110 and 115. The gap also may have a depth of about 25 nm to 75 nm; i.e., the gap may define an open region that does not include any material (i.e., the dielectric material or the metal layers). In some embodiments, a length of the gap (i.e., into the paper of the cross sectional schematic illustration shown in FIG. 2B) may be about 1 nm to 15 nm, about 15 nm to 45 nm, or about 30 nm. In some embodiments, an open gap as shown in FIG. 3 may push the near field spot generated by a campanile probe from the apex of the four-sided pyramidal-shaped structure, which may enable the campanile probe to couple with a sample being studied more efficiently.

-

A campanile probe including metal layers is operable with visible light. In some embodiments, instead of the four-sided pyramidal structure of the transparent tip having metal layers disposed over two opposing sides of the four-sided pyramidal structure, doped semiconductor layers or layers of other ceramic materials are disposed over two opposing sides of the four-sided pyramidal structure. Such a campanile probe including doped semiconductor layers or layers of other ceramic materials may be operable with infrared light. In some embodiments, the doped semiconductor layers may include conductive oxide layers or doped metal oxide layers. For example, in some embodiments, the doped metal oxide layers include layers of doped-titanium oxide, doped-zirconium oxide, doped-zinc oxide, and tin-doped indium oxide (ITO). In some embodiments, the layers of ceramic material may include titanium nitride.

-

Using nanofabrication techniques, the campanile probe 100 can be incorporated into many different transparent tips associated with scanning probe tips, including atomic force microscopy (AFM) cantilevers and optical fibers such as those used in conventional aperture-based NSOM.

-

FIGS. 4 and 5 show examples of scanning electron microscope (SEM) micrographs of a campanile probe. As shown in the SEM micrograph of FIG. 4, a campanile probe 400 includes a four-sided pyramidal-shaped structure 405 with a square or rectangular base 410. The dimension bar shown in FIG. 4 indicates that the thickness or width of the base of the four-sided pyramidal-shaped structure of the campanile probe 400 is 1.07 microns.

-

As shown in the SEM micrograph of FIG. 5, an apex 500 of a campanile probe includes a first metal layer 505, a second metal layer 510, and a dielectric material 515; white dotted lines are included in FIG. 5 to more clearly define the dielectric material and the metal layers. A gap 520 is defined between the first metal layer 505 and the second metal layer 510. The gap 520 does not include any of the first or second metal layers 505 and 510, and the dielectric material 515 has been removed from the gap. In FIG. 5, the dimension bar indicates that the width of the gap at the apex of the campanile probe is 39 nm.

-

In some embodiments, a metal-insulator-metal (MIM) probe may include a tapered cylindrical coaxial structure at an apex of a transparent tip, instead of a four-sided pyramidal-shaped structure as in a campanile probe. Light from a tapered cylindrical coaxial structure may be of a different polarization compared to light from a campanile probe including a four-sided pyramidal-shaped structure. Further, a MIM probe including a tapered cylindrical coaxial structure may have a sharper apex or end than the four-sided pyramidal-shaped structure of a campanile probe, which may improve the topographical mapping capabilities of a MIM probe.

-

FIG. 6A shows an example of a top-down schematic illustration of a tip or apex of a MIM probe. FIG. 6B shows an example of a cross-sectional schematic illustration of a MIM probe including a tapered cylindrical coaxial structure. The cross-sectional schematic illustration shown in 6B is through line 1-1 of FIG. 6A.

-

As shown in FIGS. 6A and 6B, a MIM probe 600 includes a metal probe 605, a dielectric material 610, and a metal layer 615 disposed over the dielectric material. In some embodiments, the metal probe 605 and the metal layer 615 are not in electrical contact.

-

In some embodiments, the dielectric material 610 forms a cone-shaped structure. In some embodiments, the dielectric material 610 substantially forms a right circular cone. In some embodiments, the metal probe 605 extends along an axis of the cone-shaped structure formed by the dielectric material 610; the axis of a cone is the straight line, passing through the apex of the cone, about which the base of the cone has a rotational symmetry. In some embodiments, an end of the MIM probe 600 includes an exposed tip of the metal probe 605, with the dielectric material 610 surrounding the metal probe 605 except at the end or apex and at a base of the metal probe 605. In some embodiments, the metal layer 615 is disposed over the dielectric material 610, with a portion of the dielectric material 610 not including the metal layer 615. In some embodiments, the portion of the dielectric material 610 proximate the end or apex of the MIM probe 600 not including the metal layer 615 serves to electrically insulate the metal probe 605 from the metal layer 615.

-

In some embodiments, a gap between metal probe 605 and metal layer 615 at the apex of the MIM probe 600 may be about 1 nm to 100 nm, about 2 nm to 50 nm, or less about 10 nm. With the MIM probe 600 as shown in FIGS. 6A and 6B, the gap may be considered the shortest distance between the metal probe 605 and metal layer 615. In some embodiments, sides or edges of the metal probe 605 may be spaced equidistantly apart from the metal layer 615; that is, the MIM probe 600 may be substantially circularly symmetric when viewed from the top-down, as shown in FIG. 6A.

-

In some embodiments, the metal probe 605 may comprise gold, silver, copper, or aluminum. In some embodiments, the metal probe 605 may have a diameter of about 1 nm to 3 nm, or about 2 nm, at the end or apex of the MIM probe 600 (i.e., at the top of the MIM probe 600 as shown in FIG. 6B). In some embodiments, the metal probe 605 may have a diameter of about 10 nm to 100 nm a base of the MIM probe 600 (i.e., at the bottom of the MIM probe 600 as shown in FIG. 6B).

-

In some embodiments, the dielectric material 610 may comprise an optically transparent polymer, diamond, silicon oxide, silicon nitride, aluminum oxide, indium tin oxide, and hafnium oxide. In some embodiments, the dielectric material 610 may be disposed on the metal probe 605.

-

In some embodiments, the metal layer 615 may comprise gold, silver, copper, or aluminum. In some embodiments, the metal layer 615 may be about may be about 25 nm to 75 nm thick, or about 50 nm thick. In some embodiments, the metal layer 615 may be greater than about 75 nm thick.

-

Similar to the campanile probe 100 described with respect to FIGS. 1-3, in some embodiments, the MIM probe 600 may include an adhesion layer (now shown) disposed on the dielectric material 610. The metal layer 615 is disposed on the adhesion layer. The adhesion layer may aid in adhering the metal layer 615 to the dielectric material 610. In some embodiments, the adhesion layer may comprise a metal. For example, in some embodiments, the adhesion layer may comprise titanium or chromium. In some embodiments, the adhesion layer may be about 1 nm to 5 nm thick, or about 2 nm thick.

-

Again, similar to the campanile probe 100 described with respect to FIGS. 1-3, in some embodiments, the MIM probe 600 may include a dielectric layer (not shown) disposed on the exterior surfaces of the MIM probe 600, including metal probe 605, the dielectric layer 610, and the metal layer 615. In some embodiments, the dielectric layer comprises silicon oxide, aluminum oxide, hafnium oxide, or silicon nitride. In some embodiments, the dielectric layer may be about 2 nm to 5 nm thick.

-

FIG. 7 shows an example of a flow diagram illustrating a manufacturing process for a campanile probe. The methods disclosed herein may be used to fabricate any of the campanile probes described herein. Starting at block 705 of a process 700, a transparent tip comprising a dielectric material is provided. In some embodiments, the dielectric material of the transparent tip may comprise an optically transparent material. In some embodiments, the dielectric material may comprise an optically transparent polymer, diamond, silicon oxide, silicon nitride, aluminum oxide, indium tin oxide, and hafnium oxide.

-

In some embodiments, the transparent tip may be fabricated by etching an end of an optical fiber to form a cone-shaped structure. In some embodiments, the etching process may comprise a wet-etching process using, for example, hydrofluoric acid (HF). In some embodiments, the optical fiber may have a diameter of about 1.2 microns to 3.8 microns, or about 2.5 microns. In some embodiments, the cone-shaped structure may have a tip radius of about 50 nm to 150 nm, or about 100 nm. In some embodiments, the transparent tip may be a scanning probe tip, such as an atomic force microscopy tip, for example.

-

Returning to FIG. 7, at block 710 of the process 700 a four-sided pyramidal-shaped structure is formed at an apex of the transparent tip. In some embodiments, the four-sided pyramidal-shaped structure is formed using a focused ion beam. For example, a focused ion beam may be used to remove material from the transparent tip in such a manner that the four-sided pyramidal-shaped structure remains at the apex of the transparent tip. In some embodiments, the focused ion beam may use gallium ions or argon ions. In some embodiments, the focused ion beam may use helium ions, which may improve the resolution of the focused ion beam compared to other ions.

-

At block 715 of the process 700, metal layers are deposited over two opposing sides of the four-sided pyramidal-shaped structure. In some embodiments, the metal layers may be deposited using a shadow evaporation process or an angle-resolved evaporation process. In some embodiments, the metal layers may be deposited using an atomic layer deposition (ALD) process. In some embodiments, the metal layers may comprise gold, silver, copper, or aluminum. In some embodiments, the metal layers may be about 25 nm to 75 nm thick, or about 50 nm thick. In some embodiments, the metal layers may be greater than about 75 nm thick.

-

In some embodiments, the metal layers may not be in electrical contact at the apex of the four-sided pyramidal-shaped structure or a well-defined gap between the metal layers may be present at the apex of the four-sided pyramidal-shaped structure after block 715. For example, in some embodiments, the metal deposition process at block 715 may produce a well-defined gap or space between the two metal layers.

-

In some embodiments, the metal layers may be in electrical contact at the apex of the four-sided pyramidal-shaped structure or a well-defined gap between the metal layers may not be present at the apex of the four-sided pyramidal-shaped structure after block 715. For example, in some embodiments, the metal deposition process at block 715 may not produce a well-defined gap or space between the two metal layers. When the metal layers are in electrical contact or there is not a well-defined gap at the apex of the four-sided pyramidal-shaped structure, a gap between the metal layer may be formed with an additional operation at block 720.

-

For example, at block 720 of the process 700, a gap is formed between the metal layers at an apex of the four-sided pyramidal-shaped structure. Forming a gap at block 720 helps to ensure that there is a well-defined gap or space between the metal layers and that there in not electrical contact between the metal layers. Many different processes may be used to form a gap between the metal layers at block 720.

-

In some embodiments, the gap may be formed using a focused ion beam. In some embodiments, the focused ion beam may use gallium ions or argon ions. In some embodiments, the focused ion beam may use helium ions, which may improve the resolution of the focused ion beam compared to other ions.

-

In some embodiments, forming the gap may include forming a gap between the metal layers and removing the dielectric material of the transparent tip between the metal layers, resulting in a gap as shown in FIG. 3. In some embodiments, forming the gap may include directing a focused ion beam along the z-direction of a campanile probe (as shown in FIG. 1). In some embodiments, the gap may be about 1 nm to 100 nm wide, about 2 nm to 50 nm wide, or less than about 10 nm wide, between the two metal layers, and about 25 nm to 75 nm deep; i.e., the gap may define an open region not including any material (i.e., the dielectric material or the metal layers). In some embodiments, a length of the gap (i.e., into the paper of the cross sectional schematic illustration shown in FIG. 3) may be about 1 nm to 15 nm, about 15 nm to 45 nm, or about 30 nm.

-

In some embodiments, forming the gap may include forming a gap between the metal layers, with the dielectric material of the transparent tip remaining between the metal layers, resulting in a gap as shown in FIG. 2A. In some embodiments, forming the gap may include an ion milling process in which x-y planes (as shown in FIG. 1) of material are removed from the apex of a four-sided pyramidal-shaped structure. In some embodiments, the gap may be about 1 nm to 100 nm wide, about 2 nm to 50 nm wide, or less than about 10 nm wide, between the two meal layers. In some embodiments, the gap may define a substantially flat surface of the dielectric material of the transparent tip, and separate the metal layers by about 1 nm to 100 nm, about 2 nm to 50 nm, or by less than about 10 nm. In some embodiments, a length of the gap (i.e., into the paper of the cross sectional schematic illustration shown in FIG. 2A) may be about 1 nm to 15 nm, about 15 nm to 45 nm, or about 30 nm.

-

In some embodiments, forming the gap may include applying a current and a voltage to the two metal layers of a sufficient strength to melt any metal connection between the two metal layers at the apex of the four-sided pyramidal-shaped structure. When the metal at the apex melts, the metal may form small spheres (i.e., due to surface tension), and this may sever the electrical contact between the two metal layers.

-

In some embodiments, forming the gap may include inducing mechanical stresses at the apex of the four-sided pyramidal-shaped structure that cause the end of the apex to break off or fracture. For example, due to thermal expansion mismatches between the transparent tip and the metal layers, mechanical stresses may be induced in the in the four-sided pyramidal-shaped structure by heating it up and then cooling it down. As another example, when the material of the transparent tip is a piezoelectric material, a voltage may be applied across the transparent tip which may induce mechanical stresses.

-

In some embodiments of the process 700, before block 715, adhesion layers may be deposited on the two opposing sides of the four-sided pyramidal-shaped structure. The metal layers may be deposited on the adhesion layers at block 715.

-

In some embodiments, the adhesion layers may comprise a metal. For example, in some embodiments, the adhesion layers may comprise titanium or chromium. In some embodiments, the adhesion layers may be about 1 nm to 5 nm thick, or about 2 nm thick. In some embodiments, the adhesion layers may be deposited using a shadow evaporation process or an ALD process.

-

In some embodiments of the process 700, before block 715, surfaces of the four-sided pyramidal-shaped structure may be functionalized with thiol groups (e.g., sulfhydryl groups). In some embodiments, the thiol groups may improve the adhesion of the metal layers to the dielectric material of the four-sided pyramidal-shaped structure while absorbing little or no light. Further details regarding adhesion layers and functionalization with thiol groups can be found in Terefe G. Habteyes, Scott Dhuey, Erin Wood, Daniel Gargas, Stefano Cabrini, P. James Schuck, A. Paul Alivisatos, and Stephen R. Leone, Metallic Adhesion Layer Induced Plasmon Damping and Molecular Linker as a Nondamping Alternative, ACS Nano, 2012, 6 (6), pp 5702-5709, which is herein incorporated by reference.

-

In some embodiments, the process 700 may further include depositing a dielectric layer over the four-sided pyramidal-shaped structure after block 715 or block 720. In some embodiments, the dielectric layer may be deposited on the entire four-sided pyramidal-shaped structure, including the metal layers. In some embodiments, the dielectric layer may be deposited with an ALD process or a chemical vapor deposition process. In some embodiments, the dielectric layer comprises silicon oxide, aluminum oxide, hafnium oxide, or silicon nitride. In some embodiments, the dielectric layer may be about 2 nm to 5 nm thick.

-

In some embodiments, a process similar to the process 700 may be performed, but instead of depositing metal layers at block 715, doped semiconductor layers may be deposited. Such a process may be used to fabricate a campanile probe configured to operate with infrared light, as described with respect to the campanile probe 100 shown in FIG. 1.

-EXAMPLE -

The following example of experiments performed with a campanile probe as disclosed herein is intended to be an example of methods of use of the embodiments disclosed herein, and is not intended to be limiting.

-

To demonstrate the utility of campanile probes, campanile probes with about 40 nm wide gaps were used to map out the inhomogeneous radiative recombination in individual indium phosphide (InP) nanowires (NWs), chosen because of their photoluminescence emission properties and their potential as a nanomaterial for light harvesting due to the 1.4 eV band gap and assumed low surface recombination rates. Trap states are believed to be responsible for many optical phenomena in nanocrystals and wires, including surface-state-mediated luminescence modification in InP NWs, but are not well-understood due to optical resolution limitations. Gaining this insight requires both local optical excitation and local luminescence collection.

-

A glass fiber with a campanile probe was mounted in a shear-force scanner and coupled to a 633 nm laser. The near-field spot was scanned over the sample to locally excite and collect the photoluminescence from the InP NWs. Because of the broadband enhancement, only 100 μW of pre-fiber-coupled laser excitation power was needed to collect and disperse a full emission spectrum with a high resolution grating between 760 nm and 900 nm. With a 100 ms integration time, a signal-to-noise ratio >60/1 was achieved.

-

Topography and a full spectrum were recorded at each image pixel, and photoluminescence maps were built by taking slices from the hyperspectral data. The confocal excitation power used for a far-field confocal microscope was equivalent to that used for the campanile probe to achieve a comparable signal to noise ratio. The campanile probe provided resolution approximately equal to the gap size and much higher than the confocal resolution.

-

It has previously been observed that strong photoluminescence enhancements and photoluminescence blue shifts result from passivated InP NW surfaces. This was attributed to Coulombic interactions between excitons and positively-charged trap states on the NW surfaces. These studies substantiated the hypothesis that trap states influence the optoelectronic properties of nanocrystals and nanowires much more strongly than commonly assumed. The exciton diffusion length in these materials is hundreds of nanometers, and therefore individual trap states within the diffusion volume should strongly influence the local absorption energy and charge recombination rate. However, this has not been directly observed due to the lack of resolution.

-

It is believed that the observed heterogeneity along the wires on length scales well below the exciton diffusion length are direct maps of trap-state modifications of the local exciton properties. The observed photoluminescence intensity hot spots are likely due to an increase of trap state densities (and changes in the native oxide layer) at the wire ends resulting from the NW broken-end morphology. Their spectral characteristics are consistent with a trap-induced Stark shift, predicted to be ˜60 meV to 70 meV above the band edge for positive trap states, in accordance with these experiments. Additionally, local trap states are known to cause Fermi level pinning and local band bending in some cases, which would also affect local recombination rates. In contrast, the absence of spectral variations in confocal measurements can be attributed to (a) the lack of spatial resolution and (b) the far-field photoluminescence measurement probing the entire NW thickness; i.e., surface-specific effects are obscured by bulk behavior. Catholuminesence measurements on InP NWs achieve a comparable resolution and provide complementary information. However, the large number of incident electrons fill the trap states and do not detect any spatial variation in emission from InP NWs.

-

It should be noted that the increased density of optical states at the tip apex (i.e., the apex of the four-sided pyramidal-shaped structure) will change the balance between various recombination pathways and may enable otherwise dark states to radiatively recombine. It should also be noted that measurements on NWs, and any sample thicker than about 2 nm, are not possible with a-NSOM in tip-substrate gap mode, and therefore all other near-field/tip-enhanced techniques previously demonstrated lack the signal strength and sensitivity shown here, which is critical for investigating the majority of samples.

-

Campanile probe far- to near-field transformers provide a pathway for understanding energy conversion processes at their critical length scales, which, for example, yielded new insights into the role of local trap states on radiative charge recombination in InP NWs. More generally, this example demonstrates the potential impact of the campanile probe geometry on a wide range of nano-optical measurements, since virtually all possible categories of optical imaging and spectroscopy can now be brought to the nanoscale, including Raman and IR/FTIR hyperspectral imaging, as well as white-light nanoellipsometry/interferometric mapping of dielectric functions. Additionally, it is expected that the combination of large bandwidth and enhancement will make campanile probes useful for ultrafast, pump-probe and/or nonlinear experiments down to molecular length scales, where they would be used for ultrasensitive medical detection, (photo)catalysis and quantum-optics investigations, as plasmonic optomechanics and circuitry elements, and as the cornerstone of tabletop high-harmonic/X-ray and photoemission sources.

-CONCLUSION -

Further details regarding the above-disclosed embodiments can be found in “Mapping Local Charge Recombination Heterogeneity by Multidimensional Nanospectroscopic Imaging,” Wei Bao, M. Melli, N. Caselli, F. Riboli, D. S. Wiersma, M. Staffaroni, H. Choo, D. F. Ogletree, S. Aloni, J. Bokor, S. Cabrini, F. Intonti, M. B. Salmeron, E. Yablonovitch, P. J. Schuck, and A. Weber-Bargioni, Science 7 Dec. 2012: 338 (6112), 1317-1321, which is herein incorporated by reference.

-

In the foregoing specification, the invention has been described with reference to specific embodiments. However, one of ordinary skill in the art appreciates that various modifications and changes can be made without departing from the scope of the invention as set forth in the claims below. Accordingly, the specification and figures are to be regarded in an illustrative rather than a restrictive sense, and all such modifications are intended to be included within the scope of invention.

- -
-What is claimed is: - - -1. A method comprising: -(a) providing a transparent tip comprising a dielectric material; -(b) forming a four-sided pyramidal-shaped structure at an apex of the transparent tip using a focused ion beam; and -(c) depositing a first layer of a material over a first side of the four-sided pyramidal-shaped structure and depositing a second layer of the material over a second side of the four-sided pyramidal-shaped structure, the first side and the second side being two opposing sides of the four-sided pyramidal-shaped structure, the material comprising a metal or a doped semiconductor, an apex of the four-sided pyramidal-shaped structure including a gap between the first layer of the material and the second layer of the material, the gap comprising a substantially flat surface of the dielectric material of the transparent tip. - - - -2. The method of claim 1, further comprising: -forming the gap between the first layer of the material and the second layer of the material at the apex of the four-sided pyramidal-shaped structure. - - - -3. The method of claim 1, wherein the material comprises a metal, further comprising: -before operation (c), depositing a first adhesion layer on the first side and a second adhesion layer on the second side of the four-sided pyramidal-shaped structure, wherein the first layer of the material and the second layer of the material are deposited on the first adhesion layer and the second adhesion layer, respectively. - - - -4. The method of claim 3, wherein depositing the first adhesion layer and the second adhesion layer is performed with a shadow evaporation process, and wherein the first adhesion layer and the second adhesion layer comprise a metal. - - -5. The method of claim 1, wherein the material comprises a metal, further comprising: -after operation (c), depositing a dielectric layer over the four-sided pyramidal-shaped structure, including the first layer of the material and the second layer of the material. - - - -6. The method of claim 5, wherein the dielectric layer is about 2 nanometers to 5 nanometers thick. - - -7. The method of claim 5, wherein the dielectric layer is selected from a group consisting of silicon oxide, aluminum oxide, hafnium oxide, and silicon nitride. - - -8. The method of claim 1, wherein operation (c) is performed with a shadow evaporation process. - - -9. The method of claim 1, wherein the material comprises a metal selected from a group consisting of gold, silver, copper, and aluminum. - - -10. The method of claim 1, wherein the first layer of the material and the second layer of the material are about 25 nanometers to 75 nanometers thick. - - -11. The method of claim 1, wherein the gap is about 1 nanometer to 100 nanometers wide between the first layer of the material and the second layer of the material. - - -12. The method of claim 1, wherein the dielectric material is selected from a group consisting of an optically transparent polymer, diamond, silicon oxide, silicon nitride, aluminum oxide, indium tin oxide, and hafnium oxide. - - -13. The method of claim 1, wherein the material comprises a doped semiconductor selected from a group consisting of doped-titanium oxide, doped-zirconium oxide, doped-zinc oxide, and tin-doped indium oxide (ITO). - - -14. A device comprising: -a transparent tip comprising a dielectric material, an apex of the transparent tip including a four-sided pyramidal-shaped structure; -a first metal layer disposed over a first side of the four-sided pyramidal-shaped structure and a second metal layer disposed over a second side of the four-sided pyramidal-shaped structure, the first side and the second side being two opposing sides of the four-sided pyramidal-shaped structure, an apex of the four-sided pyramidal-shaped structure including a gap between the first metal layer and the second metal layer, the gap comprising a substantially flat surface of the dielectric material of the transparent tip. - - - -15. The device of claim 14, further comprising: -a first adhesion layer disposed on the first side and a second adhesion layer disposed on a second side of the four-sided pyramidal-shaped structure, wherein the first metal layer and the second metal layer are disposed on the first adhesion layer and the second adhesion layer, respectively. - - - -16. The device of claim 15, wherein the first adhesion layer and the second adhesion layer are selected from a group consisting of titanium and chromium. - - -17. The device of claim 14, a dielectric layer disposed on the four-sided pyramidal-shaped structure, including the first metal layer and the second metal layer, wherein the dielectric layer is selected from a group consisting of silicon oxide, aluminum oxide, hafnium oxide, and silicon nitride. - - -18. The device of claim 17, wherein the dielectric layer is about 2 nanometers to 5 nanometers thick. - - -19. A device comprising: -a transparent tip comprising a dielectric material, an apex of the transparent tip including a four-sided pyramidal-shaped structure; -a first metal layer disposed over a first side of the four-sided pyramidal-shaped structure and a second metal layer disposed over a second side of the four-sided pyramidal-shaped structure, the first side and the second side being two opposing sides of the four-sided pyramidal-shaped structure, an apex of the four-sided pyramidal-shaped structure including a gap between the first metal layer and the second metal layer, the gap defining an open volume between the first metal layer and the second metal layer. - - - -20. The method of claim 1, further comprising: -removing a portion of the dielectric material at the apex of the four-sided pyramidal-shaped structure to form an open volume between the first layer of the material and the second layer of the material. - - - -
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Available from Internet, URL: <http://www.sockdreams.com/products/professional-fishnet-tights-with-cotton-sole:11749>. - -cited by examiner - - - -Kushyfoot Tights and Flats-To-Go, announced Jan. 4, 2012 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.thanksmailcarrier.com/2012/01/kushyfoot-tights-and-flats-to-go-review.html>. - -cited by examiner - - - -HUE Women's 3-Pack Micro Net Liner, announced Jun. 25, 2011 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.amazon.com/HUE-Womens-3-Pack-Micro-Liner/dp/B002JM0S5O>. - -cited by examiner - - - -Sure-Grip Terrycloth Slippers, announced Nov. 18, 2011 [online], [site visited Dec. 22, 2014]. Available from Internet, URL: <http://www.medline.com/jump/product/x/Z05-PF02319>. - -cited by examiner - - - -Springer Link; A study of the distribution of load under the normal foot during walking; Article; Oct. 1979; Three Pages; International Orthopaedics, vol. 3, Issue 2, pp. 153-157; http://link.springer.com/article/10.1007/BF00266887. - -cited by applicant - - - -D. Rosenbaum and H.P. Becker; Plantar pressure distribution measurements. Technical background and clinical applications; Oct. 30, 2003; Two Pages; 1997 Blackwell Science Ltd., Foot and Ankle Surgery, vol. 3, Issue 1, pp. 1-24, Mar. 1997; http://onlinelibrary.wiley.com/doi/10.1046/j.1460-9584.1997.00043.x/abstract. - -cited by applicant - - - -Amit Gefen, PhD; Pressure-Sensing Devices for Assessment of Soft Tissue Loading Under Bony Prominences: Technological Concepts and Clinical U; Dec. 12, 2007; Twelve Pages; vol. 19—Issue 12—Dec. 2007 (/issue/78); http://www.woundsresearch.com/article/8106. - -cited by applicant - - - -Martinus Richter, Michael Frink, Stefan Zech, Jens Geerling, Patrizia Droste, Karsten Knobloch, Christian Krettek; Technique for Intraoperative Use of Pedography; Journal; Jun. 2006; One Page; Techniques in Foot & Ankle Surgery: Jun. 2006—vol. 5—Issue 2—pp. 88-100; http://journals.lww.com/techfootankle/Abstract/2006/06000/TechniqueforIntraoperativeUseofPedography.6.aspx. - -cited by applicant - - - -Leslie Klenerman, Bernard Wood, N.L. Griffin; The Human Foot: A Companion to Clinical Studies; Book; Jan. 31, 2006; Three Pages; Springer 2006 edition; http://www.amazon.com/The-Human-Foot-Companion-Clinical/dp/185233925X. - -cited by applicant - - - -J. Alexander, EY Chao, KA Johnson; The assessment of dynamic foot-to-ground contact forces and plantar pressure distribution: a review of the evolution of current techniques and clinical applications; Abstract; Dec. 1990; Two Pages; Foot Ankle. Dec. 1990, 11(3):152-67; http://www.ncbi.nlm.nih.gov/pubmed/2074083. - -cited by applicant - - - -Bijan Najafi, Elizabeth Barnica, James S. Wrobel, Joshua Burns; Dynamic plantar loading index: Understanding the benefit of custom foot orthoses for painful pes cavus; Journal; Jun. 1, 2012; Two Pages; Journal of Biomechanics, vol. 45, Issue 9, pp. 1705-1711; http://www.sciencedirect.com/science/article/pii/S0021929012001728. - -cited by applicant - - - -Cedric Morio, Mark J. Lake, Nils Gueguen, Guillaume Rao, Laurent Baly; The influence of footwear on foot motion during walking and running; Journal; Sep. 18, 2009; Two Pages; Journal of Biomechanics, vol. 42, Issue 13, pp. 2081-2088; http://www.sciencedirect.com/science/article/pii/S0021929009003376. - -cited by applicant - - - -Yan Cong, Jason Tak-Man Cheung, Aaron KL Leung, Ming Zhang; Effect of heel height on in-shoe localized triaxial stresses; Journal; Aug. 11, 2011; Two Pages; Journal of Biomechanics, vol. 44, Issue 12, pp. 2267-2272; http://www.sciencedirect.com/science/article/pii/S0021929011004301. - -cited by applicant - - - -Herbert Elftman; A cinematic study of the distribution of pressure in the human foot; Article; Feb. 3, 2005; Four Pages; The Anatomical Record, vol. 59, Issue 4, pp. 481-491, Jul. 1934; Copyright 1934 Wiley-Liss, Inc.; http://onlinelibrary.wiley.com/doi/10.1002/ar.1090590409/abstract. - -cited by applicant - - - -Margo N Orlin and Thomas G McPoil; Plantar Pressure Assessment; Article; Jul. 30, 2014; Thirteen Pages; Physical Therapy, Journal of the American Physical Therapy Association and de Fysiotherapeut Royal Dutch Society for Physical Therapy, Phys Ther.2000, 80:399-409; http://ptjournal.apta.org/content/80/4/399.full.pdf. - -cited by applicant - - - -Daniel Tik-Pui Fong, De-Wei Mao, Jing-Xian Li, Youlian Hong; Greater toe grip and gentler heel strike are the strategies to adapt to slippery surface; Journal; 2008; Two Pages; Journal of Biomechanics, vol. 41, Issue 4, pp. 838-844; http://www.sciencedirect.com/science/article/pii/S0021929007004708. - -cited by applicant - - - -Marilyn Lord; Foot pressure measurement: A review of methodology; Journal; Apr. 1981; Two Pages; Journal of Biomedical Engineering, vol. 3, Issue 2, pp. 91-99; http://www.sciencedirect.com/science/article/pii/0141542581900017. - -cited by applicant - - -1 -1 - - -US -D 2611 - - -US -D 2627 - - -US -D 2731 - - -US -D 2732 - - -US -D 2738 - - -US -D 2742 - - -US -D 2744 - - -US -D 2858 - - -US -D 2901 - - -US -D 2909-915 -unstructured - - -US -D 2919 - - -US -D 2920 - - -US -D 2947 - - -US -D 2961 - - -US -D 2964 - - -US -D 2965 - - -US -D 2967 - - -US -D 2968 - - -US -D 2969-971 -unstructured - - -US -D 2977 - - -US -D 2978 - - -US -D 2980 - - -US -D 2983-985 -unstructured - - -US -D 2994 - - -US -D24192 - - -US - 2 60 - - -US - 2 61 - - -US - 2 66 - - -US - 2 67 - - -US - 2 80 - - -US - 2170 - - -US - 2228 - - -US - 2237 - - -US - 2239-242 -unstructured - - -US - 2272 - - -US - 2407 - - -US - 24713 - - -US - 36 37 - - -US - 36 43 - - -US - 36 44 - -A41B 11/00 -A41D 1/08 -A41D 7/00 -A43B 13/00 -A43B 17/00 -A43B 17/003 -A43B 17/02 -A43B 17/10 -A43B 19/00 -A43C 1/00 -A43C 9/00 - - -4 -7 - - - - - -Psomas -George -
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FIG. 1 is a perspective view of a non-slip hosiery showing the upper portion of the hosiery in a worn position;

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FIG. 2 is a top plan view of a non-slip hosiery shown separately from the upper portion of the hosiery for ease of illustration;

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FIG. 3 is a bottom plan view thereof.

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FIG. 4 is a front elevational view thereof.

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FIG. 5 is a rear elevational view thereof.

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FIG. 6 is a right side elevational view thereof; and,

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FIG. 7 is a left side elevational view thereof.

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The broken lines shown in FIG. 1 represent the upper portion of the non-slip hosiery as environment and form no part of the claimed design.

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The double line around the outer edges in FIG. 2 represent the thickness of material. The interior contours shown in FIG. 2 follow the exterior contours shown throughout the views.

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-CLAIM - - -The ornamental design for a non-slip hosiery, as shown and described. - - -
\ No newline at end of file diff --git a/seeking-alpha-scraper/transcripts_spider.py b/seeking-alpha-scraper/transcripts_spider.py new file mode 100644 index 0000000..3f744d1 --- /dev/null +++ b/seeking-alpha-scraper/transcripts_spider.py @@ -0,0 +1,73 @@ +import scrapy +import re + +class TranscriptSpider(scrapy.Spider): + name = 'transcripts' + + start_urls = ['http://seekingalpha.com/earnings/earnings-call-transcripts/1'] + def cleanhtml(raw_html): + cleanr = re.compile('<.*?>') + cleantext = re.sub(cleanr, '', raw_html) + return cleantext + + def parse(self, response): + # follow links to transcript pages + for href in response.css('.dashboard-article-link::attr(href)').extract(): + yield scrapy.Request(response.urljoin(href), + callback=self.parse_transcript) + + # follow pagination links + #next_page = response.css('li.next a::attr(href)').extract_first() + #if next_page is not None: + # next_page = response.urljoin(next_page) + # yield scrapy.Request(next_page, callback=self.parse) + + def parse_transcript(self, response): + i = 4 + def extract_with_css(query): + return response.css(query).extract_first().strip() + + body = response.css('div#a-body p.p1') + chunks = body.css('p.p1') + firstline = chunks[0].css('p::text').extract() + ticker = chunks.css('a::text').extract_first() + if ":" in ticker: + ticker = ticker.split(':')[1] + + name = re.compile('([A-z -]* - [A-z ,&-]*)') + execs = [] + analysts = [] + + nextLine = chunks[i].css('p::text').extract_first() + while re.match(name, nextLine) is not None: + execs.append(nextLine) + i += i + nextLine = chunks[i].css('p::text').extract_first() + print "DONE EXECS" + print i + print "Next line: "+nextLine + while re.match(name, nextLine) is not None: + analysts.append(nextLine) + i += i + nextLine = chunks[i].css('p::text').extract_first() + print "DONE ANALYSTS" + + print execs + print "-----------" + print analysts + print "^^^^^^^^^" + + #### PLACEHOLDER + i = 0 + while True: + print i ,": " , chunks[i].css('p::text').extract_first() + print i ,": " , chunks[i].css('strong::text').extract_first() + i += 1 + + #yield { + # 'company': firstline[0].split(" (", 1)[0], + # 'stockmarket': firstline[0].split(" (", 1)[1], + # 'ticker': ticker, + # 'title': chunks[1].css('p::text').extract_first(), + # 'date': chunks[2].css('p::text').extract_first() + #}